Bruker at IMC20
Enhance Microscopy with Bruker's High-Value Solutions.
Visit Bruker at Booth C-13.
IMC20 - The 20th International Microscopy Congress
Join Bruker at IMC20 in Busan, Korea from September 10 - 15 to find out more about our comprehensive range of analytical tools to enhance your microscope-based research.
Bruker's systems can be used to augment electron microscopes with additional capabilities, allowing researchers to carry out elemental and microstructural mapping using their SEM or TEM. Our electron microscope analyzer range includes systems for EDS, EBSD, WDS and micro-XRF on SEM - facilitating a comprehensive elemental and structural analysis for samples in two dimensions. Nanomechnical testing is also possible within the SEM using our picoindentors.
Ultra-fast chemical mapping of samples is possible using our range of infrared microscopes provide researchers with the ablity to perform ultra-fast chemical mapping of their samples using FT-IR, Infrared Laser Imaging (QCL), or both techniques simultaineously.
We also provide systems for the complete nanomechanical characterization of materials in the form of our advanced, turnkey atomic force microscopes.
We are excited to discuss our wide range of microscopy solutions with you and all of the possibilities they can bring to your research at IMC20. Make sure to visit Bruker at Booth C-13 to talk to one of our representatives and find out more.
If you have specific questions or problems to solve, or would simply like some privacy, we will be available for private meetings throughout the congress. Please register your interest for a meeting using the "Book a Meeting with Bruker" button.
Book a Meeting with Bruker
To book a private meeting with Bruker please fill out the form below. One of our representatives will then reach out to you.
We will be available to meet at the conference and also, for those who cannot make it, we can also arrange meetings online after the conference.