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Electron Microscope Analyzers

Latest XFlash 7 EDS Detector Series
NEW XTRACE 2 - Micro-XRF ON SEM
Discover Full Range EDS

Unique Range of Analytical Tools for Electron Microscopes

Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.

Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM
QUANTAX EBSD eFlashHD BRUKER

QUANTAX EBSD

QUANTAX EBSD system with its popular OPTIMUS 2 detector head is the best available solution for analyzing nanomaterials in the SEM
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XFlash 760 EDS spectrometer

QUANTAX EDS for SEM

The Most Advanced EDS for Your SEM, FIB and EPMA
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XFlash 7T60 EDS for TEM detector

QUANTAX EDS for TEM

Energy Dispersive X-ray Spectrometer for STEM, TEM and T-SEM
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XFlash FlatQUAD

QUANTAX FlatQUAD

Maximum efficiency in X-ray detection - our novel, 4-channel EDS detector that makes difficult analyses easy. 
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XTrace 2 micro-spot X-ray source

QUANTAX Micro-XRF

Trace element sensitivity, thin film analysis and the elemental mapping of topographic samples, all with minimal sample preparation.
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XSense WDS spectrometer

QUANTAX WDS

High precision instrument for ultra-sensitive, high resolution X-ray microanalysis in the low energy range.
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Analysis Software

ESPRIT screenshot

Software: ESPRIT Family

ESPRIT 2 unites four analytical methods under a single user interface. These include EDS for SEM and (S)TEM, WDS, Micro-XRF for SEM and EBSD.
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ESPRIT QUBE

ESPRIT QUBE Software

ESPRIT QUBE is a modern analytical software for 3D visualization and post-processing of data acquired with EBSD and/or EDS on electron microscopes.
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AMICS screenshot

AMICS Automated Mineralogy System for SEM

Automated rapid scanning for mineral and rock characterization by SEM
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Discover the World of Elemental- & Microanalysis

New EDS Banner - Darker

EDS - An Introduction to Energy Dispersive Spectroscopy

EDS is a common microanalytical technique used for the elemental analysis of samples under an electron microscope. Find out more about how EDS works and how it can be used!
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what-is-ebsd-map-example

EBSD - An Introduction to Electron Backscatter Diffraction

EBSD is powerful, SEM-based technique used to determine a material's microstructure. Find out here the science behind EBSD and what is possible using the latest detector technology.
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Trace Element Map of Ore - Zinc, Iron, Lead, Cadmium

Full Range EDS - Augmenting EDS with micro-XRF

Full Range EDS allows users to overcome the limits of conventional EDS. Using a Full Range EDS system trace element analysis, layer analysis and the identification of high-energy elemental lines is possible. 
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WDS map showing the elemental distribution of boron and carbon within a sample

WDS - An Introduction to Wavelength Dispersive Spectroscopy

WDS is an alternative technique for the elemental analysis and mapping of samples that provides an enhanced spectral resolution and signal-to-noise ratio. Find out more about the theory and uses of WDS in this article!
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Discover the EM Analyzers in our Berlin Virtual Showroom

Take a virtual tour of our showroom to see and learn more about our analytical solutions. If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.

Visitor address:

Bruker Nano GmbH 
Am Studio 2D, 12489 Berlin, Germany
Tel. +49 30 670990-0

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Contact Information

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