eWARP - The Fastest EBSD Detector Ever
Electrons Only - Direct Electron Detection Technology Designed for EBSD
eWARP is the pioneering EBSD detector that works via electrons only. Powered by a revolutionary Bruker-designed camera that combines direct electron detection and CMOS technologies, eWARP delivers unmatched performance and elevates the technique of EBSD to a new level.
eWARP is by far the fastest and most signal efficient EBSD detector in the market. The detector can acquire EBSD maps at a speed of up to 14,400 patterns/second requiring only low-to-medium electron beam conditions, e.g., an accelerating voltage of 10 kV and a probe current of 12 nA.
eWARP’s unprecedented signal efficiency stems from its unique high collection rate, provided by the wide area pixels, and its high conversion rate generated by the silicon sensor designed for SEM electron energies.
eWARP is the revolutionary core of our QUANTAX EBSD system.
A Novel EBSD Detector Powered by Bruker’s Wide ARea Pixelated (WARP) Sensor Technology
The first ever CMOS device with Bruker patented on-chip binning capability is the core of eWARP. The sensor can acquire up to 350,000 patterns per second when operated in binned mode. This lightning-fast operating mode can be used to simultaneously acquire five ForeScatter Electron (FSE) images showing various mix levels of orientation and topographic contrast.
Additionally, eWARP's unique binning capability holds a huge potential for future development of new imaging capabilities.
Signal Efficiency and Speed Gains Brought by eWARP
eWARP’s signal efficiency and speed gains represent a game changer for the EBSD community. Here are a few applications that will greatly benefit from eWARP’s performance:
- 3D EBSD – faster automatic acquisition of data cubes, using a plasma FIB-SEM, with higher pixel resolution or covering a larger volume.
- Time resolved mapping – acquisition of repetitive maps and images every few seconds to record microstructural changes inside the sample during in-situ heating and/or mechanical testing experiments.
- Large area mapping – analysis of bigger samples and/or with higher pixel resolution
- Beam sensitive materials – EBSD mapping is possible at very low electron doses.
- Improved data quality on martensitic or heavily deformed metals and alloys due to reduced interaction volume when operating at lower accelerating voltages, e.g. 10 kV.
- Enhanced spatial resolution for resolving the finest features of ultra-fine grained materials thanks to reduced accelerating voltage and probe current, even when operating at high speed.
- Excellent data integrity even on insulating materials thanks to improved beam stability.
eWARP - The Dawn of a New Era in EBSD Technology
Join us for an exclusive webinar to discover eWARP!
Learn about how Bruker's unique sensor technology makes eWARP the fastest and most signal efficient EBSD detector ever and see what this means in practice across a range of different applications.
Register now and enter the new era of EBSD.
