XFlash® 7 - EDS Detector Series
Energy Dispersive Spectrometry for SEM, FIB-SEM and EPMA
XFlash® 7 - The EDS Detector for Scanning Electron Microscopy
Achieve unmatched analysis speed!
Quantify the most complex data using the most comprehensive atomic database incl. K, L, M and N lines!
Maximize your sample throughput with the best available geometric collection efficiency of the generated X-rays!
Element Analysis in Transmission Electron Microscopy on the Nanometer Scale
XFlash® 7T - The EDS Detector for TEM, STEM and T-SEM
Identify and quantify all present elements unequivocally supported by higher energy element lines!
Succeed in TEM, STEM and T-SEM with easy-to-use powerful quantification procedures based on theoretical and experimental Cliff-Lorimer factors, as well as Zeta-factor interpolation!
Map periodic structures (atoms, layers) with high stability and as comfortably as non-periodic features supported by dedicated drift correction routines!
