LUMOS II

We believe that it is high time to make advanced techniques available to every user, regardless of their skill level. The benefits of FT-IR imaging and microscopy are too great to restrict access by cumbersome hard- and software.

From the start the LUMOS II was meant to make FT-IR imaging faster, easier, more accurate and reliable – and even more fun. Of course, this required us to include new and improve upon proven technology.

That's why we tailored the LUMOS II, its software and user interface specifically to the user. Beginners get perfect results in no time, while experts maintain total instrument control.

New Feature: The Autonomous Composition Identifier (A.I.D.) simplifies search and identification.

The Autonomous Composition Identifier (A.I.D.) is an AI-driven software tool for identifying the chemical composition of samples based on IR or Raman spectral data. It incorporates the previous O/SEARCH features and adds a multi-step algorithm to find the best match from reference spectral databases, whether dealing with pure substances or complex mixtures. A.I.D. intelligently evaluates and recommends optimal matches with a balance of reliability and sensitivity—automatically generating diagnostics and visual reports, including residual spectra and hit quality graphs. It delivers high-performance results in seconds and supports in-depth, interactive analysis of alternative identifications.

New Feature: Co-local Measurement – Unified Analysis Across IR and Raman

The Co-local Measurement function, part of the OPUS/OBJECT package, enables seamless analysis of the same region of interest on microscopic samples using both IR and Raman microscopy. It allows the transfer of overview images and measurement areas between LUMOS II, HYPERION II, and SENTERRA II instruments. This ensures that IR and Raman data are collected from precisely the same spot, enabling complementary chemical insights. Co-local Measurement bridges the gap between two techniques, improving data correlation and boosting confidence in results for heterogeneous or complex samples.

Updated Feature: OPUS/OBJECT now combines "Find Particle" and "Cluster ID"

The Particle Identification function (part of the OPUS/OBJECT package) combines the power of “Find Particles” and “Cluster ID” into one streamlined workflow. It detects particles within IR and Raman chemical images, determines their dimensions, and identifies their chemical makeup—all in one go. This integrated approach simplifies analysis and accelerates decision-making for complex samples.

New Feature: 3D FocusFusion now allows the creation of visual images of infinite "sharpness"

This new feature creates a pin sharp visual image, even if the sample has a rough surface or isn’t flat at all.
 This infinite "sharpness" in microscopic images helps in region of interest selection. Now it will be possible to generate sharp visual images of samples for which the depth of field of the LUMOS II is limited.

New Feature: FPA imaging can now follow round / circular measurement areas

Now, the measurement grid can be placed in a round shaped way to measure a whole particle filter with FPA imaging. By only measuring the actual region of interest users safe significant amounts of time during FPA measurements of round regions of interest like filters in microplastic analysis.

New Feature: High Performance Chemical Image Generation by New Adaptive K-means Clustering Function

This new function is the logical next development step for our well known Cluster analysis function.The Adaptive K-means Clustering Function is based on a new algorithm, which enables a non-supervised and autonomous determination of spectral variance within your imaging or mapping results.

•  Forecasting or time consuming searching of the included amount of chemical classes is no longer been necessary as the algorithm can predict all included chemical classes  by itself.
• This major function is important for all kinds of chemical imaging and distribution analysis of unknown samples or small structures within larger datasets.
• Together with the LUMOS II analysis and evaluation is as easy as possible and safes your valuable time and nerves.

New Feature: “Cluster ID” Function for Identification of Classes in 3D Spectral Data

Our new Cluster ID function enables the identification of clusters within imaging and mapping data using the OPUS functions: spectrum search in libraries, quick compare, or identity test.

• Easy determination of the chemical identity of classified sample components for particles, layers in laminates, components of pharmaceutical tablets and other inhomogeneous materials.
• Reliable and comprehensive statistics reports about quantity, size and of course identity of all analyzed structures is provided and leads particle and technical cleanliness analysis to a new, autonomous level.
  

Updated Feature: "Find Particles" function now contains a novel particle detection method

The proven "Find Particle" software can now be applied to both: the visual and the IR image. With this updated feature, you are able to do particle detection based on chemical images that were measured by the LUMOS II.

• While particle recognition for low contrast structures and off-white/transparent particles/fibers on off-white filter membranes can be tedious, a postrun particle determination based on the chemical IR image allows you to determine quantity and size of particles from your imaging or mapping results.
• With the Find Particle Function together with the LUMOS II you will never miss any detail – neither in visual nor in IR range.