X4 POSEIDON

• The X4 POSEIDON is a state-of-the-art, high-resolution 3D X-ray imaging system that builds upon the successes of our and well-established SKYSCAN 1272 and SKYSCAN 1275 systems. 
• The modular hardware and user-centered software of the X4 POSEIDON can be tailored to any analytical task. Thanks to its flagship technology, the system is effective at balancing field-of-view, magnification, and speed - allowing lightning fast scan times with expansive coverage and resolving features as small as 2 μm. 
• The X4 POSEIDON combines two detectors to create the first ever Multi-Vision benchtop 3D X-ray microscopy solution. Our advanced acquisition algorithms and unique GEM Plus™ feature ensure that every 3D image is optimally collected.
• The X4 POSEIDON is an accessible, walk-up system that provides unparalleled ease-of-use with a straightforward workflow, an intuitive user interface, and multi-language support.
• Requiring only standard power and a lab workbench, the X4 POSEIDON fits into any lab, bringing high-quality, non-destructive 3D imaging to everyone, everywhere!

The X4 POSEIDON is a comprehensive micro-CT solution from the start featuring many premium features to enhance the user experience.

In its essential configuration the X4 POSEIDON includes a proven reflection X-ray source and versatile flat panel detector. With these components, the system is capable of ultra-fast scanning with exceptional field-of-view and razor-sharp contrast without compromising resolution.

Whether your lab supports multiple users in diverse research and development fields or a specific industrial process, the X4 POSEIDON offers the full power of nondestructive, qualitative and quantitative 3D analysis. 

By combining Best-Scan-Geometry and Multi-Vision, the X4 POSEIDON delivers ultimate flexibility in a benchtop with Geometric Magnification Plus - GEM Plus^™.

A balance of field-of-view and resolution is achieved by moving the sample closer to the source or closer to the detector. With Best-Scan-Geometry, the detector can also be moved in a continuous way, allowing ideal cone beam utilization for a given sample size while achieving the same magnification ratio, resulting in a significant scan speed improvement.

GEM Plus™ builds on Multi-Vision and Best-Scan-Geometry to strike the perfect balance between pure resolution, scan speed and field-of-view.

The X4 POSEIDON is the only true multi-detector benchtop XRM solution. It can be equipped with a versatile flat-panel detector, a scientific-grade CMOS detector, or both!

When selecting the ideal detector for your needs, you must consider the balance between field-of-view, resolution and scan speed. If speed is of upmost importance, the flat-panel detector is ideally suited for your application. On the other hand, the sCMOS detector is the ideal choice for maximum resolution.

With the X4 POSEIDON you don't have to choose - Thanks to Multi-Vision you can have both!

The X4 POSEIDON platform allows for the on-site upgrade to Multi-Vision.

Flat-Panel Detector 

sCMOS Detector 

The X4 POSEIDON supports the latest generation of microfocus X-ray sources. The platform allows on-site source exchange as your needs evolve over time.

High Energy Reflection X-Ray Source

The reflection X-ray source produces an X-ray beam with energy up to 100 kV and 20 W power. This industry-grade source is the perfect choice for your workhorse solution in a multi-user facility, service lab or screening environment. It requires no maintenance and features a low cost of ownership.

Microfocused Transmission X-Ray Source

The transmission X-ray source achieves a 2 µm spot size and is the perfect research solution to obtain high resolution data. A maximum energy of 110 kV extends the application range to higher density and larger samples. 

Our 3D Resolution Guarantee

Every Bruker 3D X-ray Microscope comes with the unique 3D resolution guarantee. The 2D and 3D resolution performance is tested and documented with industry standard JIMA 2D and 3D QRM phantoms during factory calibration. After installation, on-site performance is guaranteed by repeating the 2D JIMA measurement.

The X4 POSEIDON can be upgraded with a 15-position sample changer to maximize instrument usage and minimize operator interaction.

The compact sample changer is ergonomically positioned in front of the instrument. The status of each position is indicated by an LED allowing sample addition or replacement at any time, even during operation. The intelligent loading algorithm (patent pending) optimizes sample throughput.

Each position accommodates samples up to 50 mm diameter and 80 mm height. Small samples can be stacked vertically and bundled to increase capacity. 

When not in use, the sample changer can stay installed while having full access to the instrument for loading large samples or specialty stages.

Enhanced throughput by source power, detector speed efficiency, variable geometry and advanced scanning modes opens new possibilities for in situ 4D-CT  experiments using proprietary specialty stages for compression testing, tensile testing and testing at non-ambient temperatures.

The Bruker material testing stages can perform compression and tensile experiments up to 4400 N and 440 N, respectively, while Bruker's heating and cooling stages can reach temperatures of 25 °C below ambient to 80 °C.

All stages are integrated into the software and hardware eliminating the need for cables. A cable feedthrough in the enclosure allows use of custom or third-party stages.

Intuitive, simple, yet powerful – the 3DxSUITE software is designed to inspire finding out what’s inside. Its user-centered design ensures even a novice user can easily start imaging. 

• Architecture allows easy extension of hard- and software
• User and data management
• Adaptable flexible graphic user interface
• Multi-language support 
• Standard includes 3D examination, visualization, and analysis
• Phase retrieval algorithms reveal features that would remain hidden with standard absorption contrast
• Advanced scan algorithms ensure the best image quality

No analytical technique is as commonplace as microscopy because seeing is believing. Whether using visible light, electrons or atomically sharp cantilevers, these probes are limited to the surface.

X-ray Microscopy is a shift in paradigm, providing a nondestructive three-dimensional view into the microscopic world; giving insight into internal structure and shedding light on the mechanism of failure or confirming successful fabrication.

3D X-ray imaging adds the third dimension to microscopy.

3D X-Ray Microscopy in Materials Science

The versatility of the X4 POSEIDON means it can be used in a wide range of materials science applications - from the research and development of novel materials to the failure analysis of high-tech electronic and optical components. 

Discover more and see examples of the X4 POSEIDON on our materials science application page. 

Micro-CT Imaging in the Life Sciences

The X4 POSEIDON is a powerful tool for the life sciences, enabling high-resolution, non-destructive micro-CT imaging. The system's benchtop design means that invaluable insights from micro-CT analysis can now benefit every biomedical lab. 

Discover more and see examples of the X4 POSEIDON on our life science application page.

Learn more about the X4 POSEIDON by watching our launch webinar. 

Materials Science Application Notes

Life Science Application Notes

Contact one of our experts about the X4 POSEIDON.

To help us put you in contact with the best expert for you, please indicate if you will be using the X4 POSEIDON in materials science or life science applications.