D8 ADVANCE ECO
The D8 ADVANCE ECO: A single solution for XRD, PDF and SAXS
D8 ADVANCE ECO – XRD at a minimum ecological footprint
The D8 ADVANCE ECO is a fully-featured D8 ADVANCE variant representing the entry point to the D8 diffractometer family platform. As the resources to procure and maintain X-ray analytics become increasingly limited, the requirements on accuracy, precision and speed are more demanding than ever.
The D8 ADVANCE ECO represents the ideal solution: Its minimum ecological footprint, ease of use, and outstanding analytical performance are the most prominent features. Various streamlined instrument configurations make the D8 ADVANCE ECO the perfect diffractometer for any budget level.
Like all other members of the D8 ADVANCE Family, the D8 ADVANCE ECO features all X-ray powder diffraction and scattering applications including
- traditional X-ray powder diffraction (XRD)
- Pair Distribution Function (PDF)analysis
- Small and Wide Angle X-ray Scattering (SAXS, WAXS)
at ambient and non-ambient conditions.
The D8 ADVANCE ECO is fully compatible to the D8 ADVANCE and therefore offers all flexibility for the future. The instrument can be easily upgraded for new applications at any time, allowing you to accomodate any X-ray diffraction and scattering applications the future may bring.
Market Gallery
Energy
Key Features
ECOlogical
Featuring a high-brilliance 1kW line focus X-ray source the D8 ADVANCE ECO has very low energy consumption, does not require external water cooling and has no special requirements concerning lab infrastructure. All that is necessary is a simple domestic wall socket. Thus, the installation and positioning of the unit is easy and
flexible: Plug’n Analyze. The D8 ADVANCE ECO has a minimum cost of
ownership and the smallest ecological footprint of any floorstanding XRD instrument. All this is achieved without sacrificing analytical performance.
Plug'n Analyze:
- No external water cooling required: Potentially saves up to 1.700 m3 tap water per year
- About 50% less consumption of electrical energy
- Only single phase power required
ECOperformance
Being the most ECOlogical X-ray diffractometer on the market, the D8 ADVANCE ECO does not compromise on its performance in terms of range of applications, data quality, flexibility, and upgradeability.
The D8 ADVANCE ECO is a fully-featured D8 ADVANCE variant for all X-ray powder diffraction and scattering applications. Being fully compatible to the D8 ADVANCE, it offers all flexibility for the future. The D8 ADVANCE ECO can be easily upgraded for new applications at any time, allowing you to accomodate any X-ray diffraction and scattering applications the future may bring to your lab:
- Phase identification
- Quantitative phase analysis
- Microstructure analysis
- Structure determination and refinement
- Residual stress
- Texture
- Grazing Incidence Diffraction (GID)
- X-ray Reflectometry (XRR)
- Small Angle X-ray Scattering (SAXS)
- Pair Distribution Function (PDF) analysis
ECOnomical
The D8 ADVANCE ECO line features high-end performance using instrument configurations for any budget level. Its operational expenses are significantly lowered due to reduced need for resources such as water and electrical power. Reliability is assured with superior instrument quality, and backed up with unrivaled component guarantees.
- Zero cost for external water
- Significantly reduced cost for power due to an efficient 1kW generator and no power for an external chiller
- Significantly extended X-ray tube lifetime
- X-ray tube guarantee: All high-brilliance X-ray sources available for the D8 ADVANCE ECO come with a 3-year warranty
- Goniometer guarantee: The robust and maintenance-free design of the goniometer provides maximum mechanical strength, long life, and thus superior data quality. This includes an outstanding 10-year warranty
- Instrument alignment guarantee
- Detector guarantee
Feature Gallery
EIGER2 R family of detectors
One Diffractometer - All Applications
Powder Diffraction
X-ray powder diffraction (XRPD) techniques are among the most important tools for materials characterization. Much of the information embedded in a powder pattern is derived directly from the atomic arrangement of the phases present. The D8 ADVANCE ECO and the DIFFRAC.SUITE software support simple execution of common XRPD methods:
- Identification of both crystalline and amorphous phases and determination of specimen purity
- Quantitative analysis of both crystalline and amorphous phases in multi-phase mixtures
- Microstructure analysis (crystallite size, microstrain, disorder…)
- Bulk residual stress resulting from thermal treatment or machining in manufactured components
- Texture (preferred orientation) analysis
- Indexing, ab-initio crystal structure determination and crystal structure refinement
Pair Distribution Function Analysis
Pair distribution function (PDF) analysis is an analytical technique that provides structural information from disordered materials based on Bragg as well as diffuse scattering ("Total Scattering"). While Bragg peaks provide information about the average crystal structure of a material (i.e. long range order), diffuse scattering allows characterization of its local structure (i.e. short range order).
The D8 ADVANCE ECO and TOPAS software represent the highest performing PDF analysis solutions on the market in terms of analysis speed, data quality and results for analysis of amorphous, poorly crystalline, nano-crystalline or nano-structured materials:
- Phase identification
- Structure determination and refinement
- Nano particle size and shape
Thin Films and Coatings
Analysis of thin films and coatings is based on the same principles of XRPD, but with further beam conditioning and angular control. Typical examples include, but are not limited to, phase identification, crystalline quality, residual stress, texture analysis, thickness determination and composition vs strain analysis. Analysis of thin films and coatings is focusing on properties of layered materials with nm to µm thickness, ranging from amorphous and poly-crystalline coatings to epitaxially grown films. The D8 ADVANCE ECO and the DIFFRAC.SUITE software enable high quality analyses of thin films including:
- Grazing Incidence Diffraction
- X-Ray Reflectometry
- High Resolution X-ray Diffraction
- Reciprocal Space Mapping
Application Gallery
D8 ADVANCE ECO Specifications
Feature |
Specification |
Benefit |
ECO |
Minimum cost of ownership Plug’n Analyze: No special needs concerning lab infrastructure No external water cooling required 1kW X-ray source power |
Only a simple domestic wall socket is required (single phase power). Thus, the installation and positioning of the unit is easy and flexible The smallest ecological footprint of any floorstanding XRD instrument Potentially saves up to 1.700 m³ tap water per year About 50% less consumption of electrical energy |
TRIO and TWIN optics |
Software push-button switch between: Motorized Divergence Slit (Bragg-Brentano) High Intensity Ka1,2 Parallel Beam High Resolution Ka1 Parallel Beam Patents: US10429326, US6665372, US7983389 |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial) |
Dynamic Beam Optimization |
Dynamic synchronization of: motorized divergence slits motorized anti-scatter screen variable active detector window 2Theta Angular range: <1 to >150 |
Data virtually free of air, instrument, and sample support scattering Significantly enhanced lower limits of detection enabling quantification for minor crystalline and amorphous phases Unparalleled performance at low 2Theta angles enabling accurate investigations of clays, pharmaceuticals, zeolites, porous framework materials and more |
LYNXEYE XE-T |
Energy Resolution: < 380 eV @ 8 KeV Detection Modes: 0D,1D, 2D Wavelengths: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
No need for Kß filters and secondary monochromators 100% filtering of Fe-fluorescense with Cu radiation Up to 450 times faster than conventional detector systems BRAGG2D: Collect 2D data with a divergent primary line beam Unique detector warranty: No defective channels at delivery time |
EIGER2 R |
The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. |
Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage Panoramic, tool-free diffracted beam optics using the complete detector field of view Continuously variable detector positioning to balance angular coverage and resolution |
TWIST.TUBE |
Easy, fast, and alignment-free switch between line and point focus applications |
No disconnecting of electric cables or water hoses or unmounting of tubes DAVINCI.DESIGN: Fully automatic detection and configuration of the focus orientation |
Sample Changers |
FLIPSTICK: 9 Samples AUTOCHANGER: 90 samples |
Operation in reflection AND transmission geometries |
D8 Goniometer |
Two-circle goniometer with independent stepper motors and optical encoders |
Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee Absolutely maintenance free drive mechanism / gearings with lifetime lubrication |
Non-ambient |
Temperature: Ranging from ~85K up to ~1800K Pressure: 10-⁴ mbar up to 1 bar Humidity: 5% to 95% RH |
Investigations under ambient and non-ambient conditions Easily exchanged stages with DIFFRAC.DAVINCI |
XRD Components
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
PLAN.MEASURE.ANALYZE with DIFFRAC.SUITE
DIFFRAC.SUITE™ offers a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of modern software technology for stability, maximum ease of use and networking.
The fully customizable user-interface is characterized by a plug-in framework, providing a common look, feel and operation. All measurement and evaluation software modules can be operated as individual applications or integrated together in DIFFRAC.SUITE's plug-in framework. Unlimited networking allows access and control of any number of D2 PHASER, D8 ADVANCE, D8 DISCOVER and D8 ENDEAVOR diffractometers within a customer's network.
Measurement Software:
WIZARD – Method planning
COMMANDER – Method execution and direct measurements
TOOLS – Service Interface
Powder Diffraction Software:
DQUANT – Quantitative phase analysis
EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis
Materials Research Software:
SAXS – Small Angle X-ray Scattering software
XRR – Comprehensive X-ray reflectometry analysis
TEXTURE – All-round Texture analysis meets ease-of-use
LEPTOS – Thin film analysis/Residual stress investigation
Webinars
D8 ADVANCE ECO Resources
Brochures & Flyers
Service & Support
- Helpdesk for technical issues with hardware, software, and applications support using web based and advanced remote service tools.
- LabScape Maintenance Service Agreements
- On-site, on-demand support
- Installation and operational qualification as well as performance verification
- Site planning, relocation, and consultation
- Replacement and spare parts, consumables, and in-person and online training
- Software updates, manuals, and LabScape MSA management (↗brukersupport.com)