The detectors of the LYNXEYE family are the world’s highest performing compound silicon strip detectors, suitable for all X-ray diffraction and scattering applications in 0D, 1D and 2D. All three detectors, the SSD160-2 and LYNXEYE-2 and LYNXEYE XE-T, operate with the common wavelengths from Cr - Ag, are maintenance free and compatible with all Bruker’s D2- and D8-diffractometers. The LYNXEYE family detectors combine stringent technical specifications, best manufacturing quality and highest system- and software-integration. The result is an outstanding level of versatility, reliability and data quality.
The second generation of LYNXEYE detectors further boosts the already outstanding performance: with 30% improved energy resolution, the SSD160-2 and LYNXEYE-2 filter fluorescence more effectively than any typical silicon based detector available on the market. For ultimate data quality, the LYNXEYE XE-T delivers excellent data quality, with an energy resolution rivaling that of secondary monochromators – but without the intensity loss.
Diffractometers equipped with a LYNXEYE detector benefit from high-speed data acquisition, excellent angular resolution and outstanding peak-to-background ratio.
With an energy resolution better than 380 eV, the LYNXEYE XE-T is the highest performing detector system on the market in terms of fluorescence filtering, and the only energy dispersive detector for 0D, 1D and 2D data acquisition.
The superb energy resolution allows unprecedented filtering of fluorescence signal and K-beta radiation, delivering data with superior signal-to-noise and improved LLD/LOD. All of this is achieved without secondary beam path optics such as monochromators or metal filters, and without the resulting intensity loss.
For example, the LYNXEYE XE-T filters 100% of Fe fluorescence excited by Cu radiation and reduces Kβ radiation to <0.1% (of CuKα). The resulting data is free of unwanted scattering and artefacts, such as absorption edges from metal filters. This is critical for reliable phase identification and quantification, especially when minor phases are concerned that are often obscured by background noise.
A common challenge encountered during powder X-ray diffraction experiments is ensuring the specimen consists of randomly oriented crystallites with appropriate dimensions. 2D X-ray diffraction is a convenient way to visualize deviations from this ideal powder condition. It is also useful to enhance the phase-identification process by correlating line profiles and to increase quantification reliability.
All detectors of the LYNXEYE family support two ways of collecting 2D data:
On D8 ADVANCE and D8 DISCOVER diffractometers equipped with Bruker’s patented 0/90° mount, 2D data is collected in the 90° orientation using a conventional 2θ scan. With BRAGG2D, included on all diffractometers, data is measured in parafocusing beam geometry and processed with a new 2D data processing algorithm. This allows the illumination of a large specimen area with the full X-ray beam, resulting in rapid assessment of sample preparation.
With its high dynamic range, high count rate and fast readout times, the LYNXEYE detector family is a great choice for all applications, including materials research.
Reciprocal Space Maps (RSM) are important to characterize the structure of epitaxial multilayers and evaluate film properties – such as strain, composition and domain effects.
Using the rapidRSM™ technology, available for all LYNXEYE family detectors, RSMs are collected as a series of 1D snapshots with essentially no dead time. This dramatically reduced the required scan time to minutes or even seconds, increasing sample throughput.
For X-ray reflectometry (XRR) and high resolution XRD (HRXRD) measurements, the signal intensity varies by several orders of magnitude over the measured range. Consequently, a high dynamic range is a key detector parameter. By switching to the 90° orientation of any LYNXEYE family detector, the dynamic range increases by almost 200x, eliminating the need for absorbers – gaining speed and improving data quality.
Specification |
Benefit |
|
SSD160-2 |
Number of Channels: 160 (up to 2400 subchannels) Energy Resolution: < 1000 eV FWHM (<426 eV Sigma) at 8keV Active Window: 12 x 16 mm²; 2.5° coverage at 250 mm radius No. defective channels: max. 1 (<1%) Max. global count rate: 125,000,000 cps |
Up to 125x faster than conventional detector systems Superb filtering of fluorescence Large dynamic range, e.g. for 0D applications |
LYNXEYE-2 |
Number of Channels: 192 (up to 2880 subchannels) Energy Resolution: < 1000 eV FWHM (<426 eV Sigma) at 8keV Active Window: 14.4 x 16 mm²; 3° coverage at 250 mm radius No. defective channels: 0 Max. global count rate: 150,000,000 cps |
Up to 150x faster than conventional detector systems Superb filtering of fluorescence Large dynamic range, e.g. for 0D applications All strips guaranteed to work at delivery time |
LYNXEYE XE-T |
Number of Channels: 192 (up to 2880 subchannels) Energy Resolution: < 380 eV FWHM (<160 eV Sigma) at 8keV Active Window: 14.4 x 16 mm²; 3° coverage at 250 mm radius No. defective channels: 0 Max. global count rate: 150,000,000 cps |
Up to 150x faster than conventional detector systems in high-intensity mode; 450x faster in high energy-resolution mode Large dynamic range, e.g. for 0D applications All strips guaranteed to work at delivery time No need for Kß filters and secondary monochromators 100% filtering of Fe-fluorescense with Cu radiation |
Spatial resolution |
75 µm |
|
Background noise |
< 0.05 cps for whole detector |
Excellent signal-to-noise data |
Wavelengths |
Cr, Co, Cu, Mo and Ag |
One detector for all wavelengths |
Sensor thickness |
500 µm |
> 99% Cr, Co, Cu; 50% Mo; 30% Ag sensor efficiencey |
Scan modes |
0D: scanning 0D mode 1D: scanning or fixed mode, rapidRSM™ and rapidNon-Ambient 2D: Scanning 2D mode and BRAGG2D |
Extremely large dynamic range in 90° rotated orientation Rapid 1D measurements BRAGG2D: Collect 2D data with a divergent primary line beam |
Operating Media |
None |
No maintenance and no additional cost for consumables |
Applications |
XRR, HRXRD; phase identification, quantification, Structure refinement, residual stress, texture |