FT-IR 분광소프트웨어

OPUS: 최신 버전

LATEST RELEASE

OPUS Workstation

OPUS 9.0 is the latest releases of OPUS, the leading software for measurement, processing and evaluation of IR, NIR and Raman spectra. OPUS is a true 64 Bit software, delivering utmost performance under native 64 Bit operation.

 

OPUS 9.0 is released for Windows 10 and for Windows 11.

 

OPUS 9.0 comes with a fresh and modernized user interface and contains many further improvements for FT-IR, QCL- and Raman microscopy and the new MPA III runs with the validation program OVP-X.

New OPUS 9.0 features include:

  • New Graphical User Interface (GUI): The GUI is modernized with ribbons as it is well-known from Microsoft Office.
    Getting started with OPUS is made easier for new users because the GUI follows the philosophy of Microsoft Office.
    Customers who have worked with the previous user interface will quickly find their way around because the icons are unchanged.
    BRUKER Optics has taken the opportunity to review the allocation of all functions, grouped them and assigned some to more suitable menus.
    The HOME menu gives the user quick access to all essential and frequently used functions. As usual, the views differ depending on the selected workspace.

 

The menu shows well-known icons in a modern design with ribbon-technology.

Overview of the complete user interface with OPUS Browser and Status Bar.

 

Ribbons can be customized with user rights of Admin or LabManager.

New Graphical Method Editor in the Rapid Scan Time Resolved Measurement Dialog: The “Method Editor” tab of the “Rapid Scan Time Resolved Measurement” dialog has been extended by a graphical representation of the TRS-method. The method is shown as a sequence of graphical blocks, each block standing for a command/line in the method.
Blocks can be inserted into the method, moved to another position or deleted, by mouse-drag and drop. Command parameters are entered or edited via specific user controls on each block. The familiar text representation is still available.

 

 

  • Autonomous Composition Identifier Software: Composition-AID: Chemical composition identification of samples based on their IR or Raman spectral data. A multi-step artificial intelligence algorithm determines the best match for the query spectrum using reference spectral databases.
    The algorithm automatically evaluates results for pure substances as well as complex mixtures without requiring any input from the user. For the recommended and possible alternative results, a composite from the weighted component spectra and its difference to the sample spectrum is calculated.

 

 

Highlights of Composition-AID:

  • Best match recommendation for optimal balance of reliability and sensitivity
  • Extensive hit quality diagnostics:
    o    difference spectrum between composite and query spectrum (=residual)
    o    graph of hit quality and unexplained peaks plotted against component number
  • High performance – comprehensive multi-component analysis in seconds
  • Interactive report generation of single and multiple alternative results
  • Particle Identification: It combines capabilities of OPUS functions “Find Particles” and “Cluster ID” to ease the workflow for detection and identification of particles from IR and Raman images. The new function allows to detect particles in IR and Raman chemical images and determine their dimensions and identity in a single evaluation step.

 

 

  • Particle Statistics: The tool is for examining results from IR and Raman particle analysis by filtering and graphically displaying the data according to attributes like dimension, identity and hit quality.

 

 

  • Microplastic Classification: The microplastic classification function is a machine-learning based classifier that determines the identity and dimensions of microplastics particles that have been measured by FT-IR imaging (i.e. with LUMOS II-IMG). The classifier has been trained on reference data which has been recorded on aluminum oxide (“Anodisc”) filters.

 

  • Anodisc surface model: The visual quality of microscopic overview images is optimized for uneven aluminum oxide (“Anodisc”) filter surfaces. The surfaces of Anodisc filters, which are a commonly used substrate in microplastics analysis can show some unevenness of the surface. The “Anodisc surface model” function determines this variation in the filter topology and generates a model for focus correction during visual image generation, resulting of higher sharpness of the entire field of view. The improved visual image quality allows a better correlation of the visual and IR image. Furthermore, a better detection of particles based on the visual image for single point analysis is achieved.

 

 

  • Flat-plane interpolation for overview images: It is used for optimization of the visual quality of microscopic overview images of tilted sample surfaces. The “Flat-plane interpolation” function determines the tilt of flat sample surfaces which are not perfectly levelled. The focus is corrected accordingly during visual image generation, resulting in a higher sharpness of the entire field of view.

 

  • 3D Quick Compare: Evaluation of 3D spectral data by using the OPUS Quick Compare methods. IR and Raman images are generated by correlation of pixel spectra with known reference spectra. A user-defined threshold sets the minimum correlation coefficient needed for identifying or verifying the presence of the reference components.

 

  • Co-local-measurement: Analysis of identical region of interest on microscopic samples using both Raman and IR microscopy. The “Co-local measurement” function allows to transfer the overview image and the measurement area between LUMOS II, HYPERION II and SENTERRA II. This makes the analysis of the identical region of interest possible, using both the IR and Raman technology.

 

LATEST RELEASE

OPUS-TOUCH

Version 6 is the latest release of OPUS-TOUCH, the first true touch-operated software for infrared spectroscopy. OPUS-TOUCH provides highest accessibility for FT-IR beginners and full instrument control for experts, including monitoring of hardware and system status.

Autonomous Composition Identifier, or A.I.D.

Fast and reliable analysis function for complex mixtures and pure substances. The new Composition-ID function is a completely new designed spectra search tool for mixtures and pure components. It requires no input for the expected number of components, provides a multitude of results in one run and automatically selects the one that fits best.   

 

Product Measurement Workflow

The product measurement workflow enables fast and efficient measurement and evaluation of various samples. Each product precisely defines the measurement and evaluation process and can include an image to facilitate easy navigation within the workflow. Individual products can also be added directly to the home screen for quick access. The result view consolidates multiple results and visually highlights predefined warning and alarm limits for better clarity and decision-making. 

Trend View

The trend view enables the visualization of various result types obtained from product measurements, including Quant 1, Quant 2, and Quick Compare. Outliers, such as those exceeding warning or alarm limits, are clearly highlighted graphically. Users can select different time ranges for analysis and export results in CSV format.

 

ONet Client Functionality

OPUS TOUCH can serve as an ONet client for ONet 4.0, enabling centralized setup, administration, and control of a network of FTIR instruments from any remote location worldwide.

  • Data Exchange: Products can be received from the ONet server, and spectra and results can be uploaded back to it. This integration ensures streamlined operations, robust data access, and efficient instrument network management.
  • Local Accessibility: All data and required files remain available locally, allowing for uninterrupted sample analysis even during network downtime.
  • User Management: User rights are managed via ONet, with fine-tuning possible directly on the client.
  • Monitoring: ONet receives status updates and PQ/OQ reports from connected clients.

 

The Tutorial Center

The tutorial center, accessible via a new icon in the upper-right corner of the screen, offers a library of video tutorials covering a wide range of TOUCH functions. Context-specific videos are displayed based on the currently active view, ensuring relevant guidance. All tutorials include both audio and subtitles, providing a user-friendly and accessible learning experience.

최신 RELEASE

BRAVO

Version 2.2.4 is the latest release of the BRAVO handheld Raman spectrometer software, supported by OPUS 8.8.4. Be guided straightforward through a reasoned workflow, including various analysis tools and reporting options, while simply touching icons on a large touch screen. BRAVO is designed for the operation in validated environments of the pharmaceutical industry and offers all required functionality to meet regulatory requirements out of the box.

 

New BRAVO handheld Raman features include:

  • BRAVO Web Access
    A secure https interface enables to access system information, licensing functionality, EAP-TLS certificate management and a BRAVO screen sharing functionality.
  • BRAVO Viewer
    The secure https web access enables screen sharing of the BRAVO GUI as well as full remote control of the BRAVO software via a web browser.
  • Device Diagnostics
    Updated device diagnostics functionality for fast and easy access to performance status information.
  • EAP-TLS WiFi Authentication
    Support of EAP-TLS protocol with custom certificates.
  • Service Mode
    New service mode functionality to enable flawless maintenance by Bruker service.
  • NTP time server connection
    A new option for controlling the system date & time is the stand-alone connection to a NTP time server.


최신 버전

ONET

ONET 3.1 은 브라우저 기반 웹 포털을 통해 FT-IR 및 FT-NIR 분광계의 글로벌 네트워크를 초기 설정, 관리 및 제어할 수 있는 최신 버전의 서버 응용 프로그램입니다. 분광계에서 로컬로 측정된 모든 데이터는 중앙에 저장됩니다. 그럼에도 불구하고 모든 데이터와 필요한 파일은 로컬에서도 사용 가능하므로 네트워크가 일시적으로 연결되지 않은 경우에도 샘플을 언제든지 분석할 수 있습니다.

ONET 3.1 의 혁신: 

  • 새롭고 현대적인 사용자 인터페이스
  • ONET 클라이언트와의 더 빠르고 효율적인 소통
  • .csv 파일을 가져와서 참조 값을 간단하게 할당
최신 버전

CMET

공정 소프트웨어 CMET 3.1은 강력한 FT-NIR 공정 분광기와 고객의 공정 제어 센터 간의 인터페이스의 최신 버전입니다. 공정 제어 스테이션에서 CMET로 전송된 신호는 목표 측정을 시작합니다. 이러한 방식으로 얻은 측정 데이터는 시각화 및 보관을 위해 공정 제어 스테이션으로 전송되고 공정 모니터링 및 최적화에 사용됩니다. Modbus, Profibus DP, 4-20mA 및 OPC와 같은 다양한 표준 통신 프로토콜의 지원은 최적의 연결을 보장합니다.

CMET 3.1 의 혁신:

  • Windows 서비스로서의 온라인 BIAS, 레시피 제어(단순한 배치 프로세스 처리) 및 CMET
  • Q412 시리즈 방출 헤드 및 새로운 단일 램프 모드 지원
  • 새로운 인터페이스, 로그인 기능 및 데이터베이스 연결이 포함된 추세 차트