The focus of the 2022 AFM User Meeting was the use of AFM for high-resolution imaging and the nanochemical, nanomechanical, and nanoelectrical characterization of advanced materials used in semiconductor and nanomaterials research.
The meeting includes two sessions — each with a different focus — comprised of a series of talks, live Q&A sessions, and technical demonstrations of cutting-edge Bruker AFM instruments, including the new Dimension IconIR AFM.
Our speakers discuss their latest research with AFMs and cover topics as varied as
Length | Topic | Speaker(s) |
---|---|---|
5 minutes | Welcome/Introduction | Dr. Peter De Wolf, Worldwide Application Director, Bruker Nano Surfaces & Metrology |
15 minutes | Latest Bruker AFM Developments | Dr. Mickael Febvre, Application Manager Europe, Bruker |
Length | Topic | Speaker(s) | Abstract |
---|---|---|---|
25 minutes | Nanoscale Electrical Characterisation of Nitride Transistor |
Prof. Rachel Oliver, University of Cambridge, UK |
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20 minutes | Direct Observations of Mineral-Fluid Reactions using Atomic Force Microscopy |
Dr. Encarnación Ruiz Agudo, University of Granada, Spain |
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20 minutes | Analysis of Fuel Cell and Electrolyzer Components with Nanoelectrical and Nanomechanical AFM |
Dr. Tobias Morawietz, German Aerospace Center (DLR), Germany |
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15 minutes | Live Bruker AFM Demonstration | Dr. Vishal Panchal, Application Scientist, Bruker |
Length | Topic | Speaker(s) | Abstract |
---|---|---|---|
25 minutes | AFM-IR Insights into the Nanoscale Polymer Interphase |
Dr. Suzanne Morsch, University of Manchester, UK |
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20 minutes | The Use of AFM Electrical Modes (SCM, SSRM and sMIM) in the Characterization of Dies and Semiconductor Materials | Dr. Rosine Coq Germanicus, ENSICAEN Research Center, France | Read More |
15 minutes | Mechanical Mapping of Lignocellulosic Surfaces |
Dr. Claudia Gusenbauer, University of Natural Resources and Life Sciences, Austria |
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10 minutes | Bruker Demonstration: Dimension IconIR | Dr. Miriam Unger, Application Manager, Bruker | |
5 minutes | Q&A and Closing |
Dr. Peter De Wolf, Worldwide Application Director, Bruker Nano Surfaces & Metrology |