Dimension IconIR
Dimension IconIR
Bruker’s large-sample Dimension IconIR™ system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications. For example, the new IconIR polymer solution is an all-in-one package designed to include everything one would need to address key polymer research needs.
The Dimension IconIR platform has the highest performance in the world for AFM-IR measurements, leveraging advancements in IR laser sources, system designs, and operating modes. Read the application note "High-Performance Nanoscale IR Spectroscopy and Imaging with Dimension IconIR" to learn more.
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First-and-Only nanoIR Capabilities and Performance
In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity.
Only Dimension IconIR delivers:
- High-performance nanoIR spectroscopy with accurate and repeatable FTIR correlation, <5 nm chemical resolution, and monolayer sensitivity
- Correlative chemical imaging with PeakForce Tapping® nanomechanical and nanoelectrical modes
- Highest Performance AFM imaging and unmatched sample flexibility with large-sample accommodation*
- The broadest available range of coordinating applications accessories and AFM modes, including the new Surface Sensitive AFM-IR Mode
*The standard system supports samples up to 150 mm, with versions capable of accommodating larger samples also available.
Most Complete Correlative Microscopy
Together with Bruker-exclusive PeakForce Tapping nanoscale property mapping and proprietary nanoIR spectroscopy technology, the Dimension IconIR system's large-sample platform is uniquely well-suited for correlative studies of materials and active nanoscale systems in electrical or chemically reactive environments—even complex systems with strong mechanical heterogeneities.
IconIR delivers:
- Advanced quantitative property mapping techniques
- The most complete correlative microscopy solution for quantitative nanochemical, nanomechanical, and nanoelectrical characterization
Highest Performance NanoIR Spectroscopy
Bruker is the innovator for photothermal AFM-IR-based nanoIR spectroscopy with our patented, unique suite of nanoIR modes. These modes enable IconIR to provide high-speed, high performance spectra that correlate to FTIR spectroscopy. The variety of modes support the measurement of a wide range of samples for both industrial and academic users.
IconIR delivers:
- Highest performance, rich, detailed spectra with FTIR correlation achieving single molecular spectroscopy
- Resonance-enhanced AFM-IR, the preferred technique for the nanoIR community, with the largest number of scientific publications
- Highest performance Tapping AFM-IR spectroscopy equivalent to Resonance-Enhanced AFM-IR
Highest Resolution Chemical Imaging
The Icon’s industry-leading AFM performance and Bruker’s patented Tapping AFM-IR imaging together enhance the spatial resolution and sample accessibility of our nanoIR technology, extending its application to segments not currently addressed by the photothermal AFM-IR technique.
IconIR provides:
- <5 nm chemical spatial resolution for imaging over a broad range of sample types, including soft samples
- Monolayer sensitivity for imaging of thin films and biological structure
- Consistent, reliable, and high-quality publishable data
- Reliable surface sensitive chemical measurements for polymeric films
Chemical Insights Into the Very Top Surface Layer
Utilizing Bruker’s new patented Surface Sensitive AFM-IR Mode, IconIR significantly decreases chemical probing depth from greater than 500 nanometers to tens of nanometers, while eliminating the need for cross-sectioning to seamlessly combine high spatial resolution and high surface sensitivity chemical imaging.
Dimension IconIR for Nanoscale Chemical and Surface Analysis
The Dimension IconIR enables correlative nanoscale chemical, mechanical, electrical, and morphological characterization by combining nanoIR spectroscopy with PeakForce Tapping–based AFM property mapping on a large‑sample platform. It is designed for studies that require high‑resolution chemical imaging with direct FT‑IR correlation, alongside nanomechanical and nanoelectrical measurements on the same sample area.Representative applications include:
- Nanoscale chemical imaging/spectroscopy with sub‑10 nm spatial resolution, monolayer sensitivity
- Correlative nanochemical, nanomechanical, and nanoelectrical mapping using nanoIR spectroscopy combined with PeakForce Tapping modes
- Polymer blends and block copolymers, including PS‑LDPE blends and PS‑b‑PMMA systems, with clear chemical contrast between phases
- Thin films and layered materials, where monolayer‑level chemical sensitivity is required
- Composite and embedded materials, such as carbon fibers in epoxy, requiring correlated chemical and property mapping
- Large or non‑standard samples, enabled by the system’s large‑sample architecture and motorized positioning stage
- Materials research in electrically or chemically active environments, using a broad range of AFM modes and accessories
LEARN MORE:
Polystyrene & Polyethylene Blend
In this first real‑time demonstration, a Bruker nanoIR applications expert investigates a polystyrene and low‑density polyethylene (LDPE) blend in which LDPE forms globules on the surface of a polystyrene matrix.
- Using Bruker NanoScope® software, the session starts with topography, then introduces PLL1 frequency, tapping phase, and IR channels to build material contrast. By targeting aromatic bands in polystyrene and the polyethylene backbone, the demo shows strong chemical contrast between the two materials, including contrast inversion when the laser wavenumber is changed.
- Uses PLL1 frequency data to confirm a clean IR response independent of spectral artifacts, demonstrating true chemical sensitivity. The video concludes with spectroscopy measurements, including line scans and point spectra, clearly differentiating polystyrene and LDPE based on their infrared signatures.
This second demonstration revisits the same polystyrene and low‑density polyethylene (LDPE) blend using PeakForce KPFM to correlate chemical, mechanical, and electrical properties within a single measurement workflow.
- Collects electrical property data simultaneously, revealing how local electrostatics and polymer chemistry influence the measured work function.
- Demonstrates co‑localized chemical, mechanical, and electrical mapping, with the same LDPE and polystyrene features visible across all channels.
- Highlights the advantage of true co‑local measurement, eliminating the need to infer relationships between chemistry, mechanics, and electrical behavior from separate experiments.
- Provides a complete, spatially consistent picture linking composition directly to material behavior at the nanoscale.
In this third real‑time demonstration, a Bruker nanoIR applications expert shows nanoscale chemical and mechanical characterization of a polystyrene and low‑density polyethylene (LDPE) blend, highlighting simultaneous multi‑channel measurement capabilities.
- Collects AFM topography, modulus, adhesion, and IR signal in a single pass, revealing LDPE features in polystyrene matrix.
- Demonstrates UI‑guided point selection for nanoscale IR spectroscopy, with ~5 s per point acquisition.
- Correlates AFM‑IR data with FTIR spectra for material identification.
- Uses offline analysis to clearly differentiate IR signal and spectral features of LDPE versus polystyrene domains.
PS-PMMA Blend
In this real‑time demonstration, Dimension IconIR is used for correlative chemical, mechanical, and morphological analysis of a 1:1 polystyrene/PMMA polymer blend.
- Begins with AFM topography and phase imaging, showing limited material contrast and an apparent (misleading) homogeneity.
- Uses AFM‑IR to reveal heterogeneity; nanospheres and clear phase segregation between PMMA and polystyrene domains.
- Demonstrates simultaneous AFM and IR data collection, enabling direct correlation of morphology, mechanics, and chemistry.
- Confirms blend composition and visualizes component distribution through phase‑resolved chemical mapping.
PMMA Beads in Epoxy
This first demonstration uses tapping AFM‑IR to identify and differentiate chemical species in a sample containing PMMA beads embedded in an epoxy matrix on a thick sulfite substrate.
- Overlays the AFM image with the optical image, precisely locating measurement area.
- Performs four point spectroscopy measurements (two on the matrix, two on PMMA particles), with three repeat sweeps per point (10 s each).
- Shows clear, repeatable spectral differences between matrix and particles, including a distinct carbonyl band, with intensity variations linked to local thickness.
- Acquires AFM‑IR images at 1510 and 1730 wavenumbers, producing contrast inversion between PMMA and epoxy.
- Confirms chemical contrast and material identity through correlation with FTIR spectra.
This second demonstration showcases selective, high‑acuity nanoscale chemical and mechanical analysis on a microtomed epoxy film containing embedded PMMA beads, polystyrene beads, and carbon black.
- Demonstrates highly targeted AFM‑IR measurements, selecting specific PMMA beads and tuning the IR wavelength to probe the carbonyl band in PMMA and chemical features of the epoxy resin.
- Switches between sample- and tip-scanning modes, illustrating workflow flexibility and access to legacy Bruker modes.
- Uses PeakForce QNM in air on the same sample to collect mechanical data.
- Shows that, despite similar elastic moduli, PMMA, polystyrene, and epoxy can be mechanically distinguished, enabling material discrimination independent of tapping mode typically used for AFM‑IR.
- Demonstrates how chemical and mechanical properties can be decoupled and analyzed in a single, correlative workflow.
Frequently Asked Questions
Dimension IconIR supports Tapping AFM-IR and Resonance Enhanced AFM-IR as standard modes. Surface Sensitive AFM-IR and REFV AFM-IR are available as options, depending on the system’s configuration and accessories.
IconIR supports samples up to 150 millimeters in diameter and is designed for either multiple coupons or large-sample workflows. Bruker also has the Dimension IconIR 300 for full access on 200 mm and 300 mm wafers. If you need to work with larger or heavier samples, consult Bruker for custom solutions.
Standard Dimension Icon AFMs cannot be routinely upgraded to IconIR systems. IconIR is a dedicated platform with integrated IR capability.
More About Bruker's Nanoscale Infrared Technology
Yes. Bruker’s photothermal AFM-IR technology produces spectra that are directly comparable to FTIR spectra, as demonstrated in published documentation and peer-reviewed articles. AFM-IR spectra can be searched directly against FTIR spectral databases. If FTIR-like spectral analysis is critical for your application, our experts can provide evidence showing spectral correlation.
Photothermal AFM-IR provides direct absorption-based spectra that closely match FTIR results and are easier to interpret than Raman-AFM or s-SNOM. Further, Photothermal AFM-IR signals are amplified by the resonant enhancement of the cantilever providing the best signal-to-noise of those techniques. Bruker offers s-SNOM as a separate option for advanced near-field studies.
Bruker nanoIR systems routinely achieve chemical imaging with spatial resolution below 10 nm and can detect single molecular layers. Actual performance depends on your sample and selected measurement mode.
Yes, photothermal AFM-IR can chemically map and identify particles smaller than one micron, including nanoplastics and environmental contaminants. Direct correlation to FTIR provides ready interpretation in particles as small as 10 nm.
Bruker’s photothermal AFM-IR systems typically require a single socket of standard electrical power,and CDA. Specific requirements may vary by model, so request a site preparation guide from your Bruker representative.
Bruker photothermal AFM-IR systems primarily use quantum cascade lasers (QCLs) that deliver stable, reliable performance and broad coverage across the mid-infrared fingerprint region as well as optical parametric oscillators (OPOs) for the C-H, O-H, N-H stretching region. Multiple QCL chips can be combined to access all key spectral windows required for routine and advanced research, and additional sources are available for specialized applications. Bruker’s application experts can help you select the optimal laser configuration to match your measurement needs and ensure sufficient spectral resolution for both standard and demanding experiments.
Measurement times vary by application, but point spectra can be acquired in seconds, chemical maps in minutes, and automated recipes can be tailored for high-throughput workflows.
Routine maintenance includes probe replacement, laser alignment checks, and calibration with reference samples. Bruker provides detailed maintenance protocols and support plans.