HYPERION II

Above all, it is about having complete access to an instrument. Access to the experiment, the samples, and the parameters. This is the foundation of the HYPERION II and its most valuable asset: providing full control.

Whether FT-IR measurements in single point mode, mapping or imaging with different detectors or objectives, special sample stages or with ATR or Grazing Angle objective.  At any point you can influence the outcome of your results - and make them better.

This is the clear difference to our LUMOS II IR microscope. Where the LUMOS II relieves the user of tedious experimental details and automates the measurement process, the HYPERION II remains a precise tool that only does what the user demands.

Many users know the HYPERION II and its strengths through its predecessor. For almost 20 years, it has been an innovation force in IR microscopy and imaging. The things that made HYPERION an outstanding FT-IR microscope are still there - only better, faster and improved.

The HYPERION II continues to have all the features you require in your daily research routine: liquid nitrogen and thermoelectrically cooled MCTs, focal plane array imaging detectors, visual and infrared enhancement tools, and of course an abundance of dedicated accessories.    

In the end, we wanted to set the benchmark in FT-IR microscopy and imaging once again and live up to our name as an innovation leader by introducing new and exciting technology while keeping established and valued methods.

QCL and FT-IR in a single instrument

For the first time, users can access an IR microscope that combines FT-IR and QCL technology in one instrument. With this, we are opening a completely new door to life science and material research.

Collect an FT-IR spectrum, select the wavelengths you want to investigate using QCL and create stunning chemical images in a matter of seconds.

With this completely new approach of FT-IR and infrared laser imaging, we finally give users, researchers, and scientists a tool to develop new applications, but also to improve established and proven approaches.

A true QCL microscope with exceptional performance

The HYPERION II offers uncompromised QCL microscopy in a state-of-the-art FT-IR microscope. In fact, we have specifically developed and patented a novel coherence reduction technology to enable unparalleled IR laser imaging performance - without digital post-processing.

To illustrate: In classical FT-IR, spatial coherence does not play a role. In IR microscopic measurements with a QCL, however, spatial coherence phenomena inevitably occur. These fringes and speckles in IR images and spectra are generally considered to be harmful for chemical imaging (see adjacent; DOI: 10.1002/jbio.201800015).

Indeed, it is not trivial to separate the sample's chemical information from the physical information describing the phase relationship of the scattered photons. The HYPERION II addresses this problem pragmatically and solves it by smart hardware design and lets you acquire artifact-free chemical imaging data.

Comparing FT-IR and QCL spectroscopy

Comparing the techniques would imply that both can perform the same task equally well - a popular misconception. FT-IR and infrared laser imaging have distinct advantages and only a practical combination of both can achieve the best results.

We know that most scientists and researcher do not want to miss the universality of FT-IR. They don’t like being restricted to a single, cutting-edge technique without point of reference. Fortunately, the HYPERION II can be considered both: an exceptional FT-IR imaging microscope and an ambitious QCL microscope.

We have addressed this duality and where QCL technology records data significantly faster at the same signal to noise, it is still limited to a small range of the MIR. Again, we stay true to the concept of the HYPERION II. You choose. You have full control.

New Feature: High Performance Chemical Image Generation by New Adaptive K-means Clustering Function

This new function is the logical next development step for our well known Cluster analysis function.The Adaptive K-means Clustering Function is based on a new algorithm, which enables a non-supervised and autonomous determination of spectral variance within your imaging or mapping results.

•  Forecasting or time consuming searching of the included amount of chemical classes is no longer been necessary as the algorithm can predict all included chemical classes  by itself.
• This major function is important for all kind of chemical imaging and distribution analysis of unknown samples or small structures within larger datasets.
• Make analysis and evaluation is as easy as possible and safes your valuable time and nerves.

New Feature: “Cluster ID” Function for Identification of Classes in 3D Spectral Data

Our new Cluster ID function enables the identification of clusters within imaging and mapping data using the OPUS functions: spectrum search in libraries, quick compare, or identity test.

• Easy determination of the chemical identity of classified sample components for particles, layers in laminates, components of pharmaceutical tablets and other inhomogeneous materials.
• Reliable and comprehensive statistics reports about quantity, size and of course identity of all analyzed structures is provided and leads particle and technical cleanliness analysis to a new, autonomous level.
  

Updated Feature: "Find Particles" function now contains a novel particle detection method

The proven "Find Particle" software can now be applied to both: the visual and the IR image. With this updated feature, you are able to do particle detection based on chemical images that were measured by the LUMOS II.

• While particle recognition for low contrast structures and off-white/transparent particles/fibers on off-white filter membranes can be tedious, a postrun particle determination based on the chemical IR image allows you to determine quantity and size of particles from your imaging or mapping results.