Rapid EBSD
An alternative to fast EBSD mapping
RAPID EBSD is a new and powerful ESPRIT 2 software package feature, based on a method developed at Imperial College in London, UK. It combines high quality ARGUSTM ForeScatter (FSE) images with state-of-the-art image segmentation algorithms and sparse EBSD/EDS data acquisition to reconstruct normal EBSD/EDS maps in the shortest time possible.
Benefits:
- Increased efficiency
- Fast mapping with long exposure times
- Better statistics in EDS spectra
- Less damage to beam sensitive samples
- Reduced charging on non-conductive samples
Applications:
- Grain size statistics
- Crystallographic texture
- Materials producing very weak diffraction signal
- Beam sensitive samples
ARGUS ForeScatter (FSE) orientation contrast images of a 3d printed stainless steel specimen (Fig. 1a: low magnification).
ARGUS ForeScatter (FSE) orientation contrast images of a 3d printed stainless steel specimen (Fig. 1b: measured area)
Fig. 2: RAPID EBSD Segmentation image - one EBSD measurement will be done per segment.
Fig. 3: Orientation distribution results (IPF X map) from the reconstructed RAPID EBSD measurement (using segmentation). RAPID EBSD measurement was 5 times faster as the one in Fig. 4.
Fig. 4: Orientation distribution results (IPF X map) of the same area measured by standard EBSD measurement (i.e. using a regular grid of points) using the same beam and geometry settings as in Fig. 3.