QUANTAX ED-XS: The Cost-Effective Solution for Material Characterization using EBSD and EDS Analysis
A Cost-Effective System for Combined EBSD EDS Analysis
Combined Energy Dispersive Spectroscopy (EDS) and Electron BackScattered Diffraction (EBSD) is a key approach for the characterization of the microstructure of crystalline materials. This combined method allows researchers to correlate chemical and crystallographic variations and to identify or differentiate the present phases.
Bruker’s QUANTAX ED-XS is an affordable EDS & EBSD system designed to enable the large community of entry-level SEM users in academic research and industry to benefit from the power of EDS and EBSD techniques whilst optimizing their lab resources.
To achieve this goal, Bruker has integrated a 30 mm2 XFlash® Silicon Drift Detector, providing high throughput rates and light element detection capabilities, with the recently developed e-Flash XS, the most reliable and affordable CMOS-based EBSD detector available. This solution provides the full functionality required for qualitative and quantitative EDS and EBSD analysis, with all the data collected integrated under the ESPRIT software.
In this webinar, we will demonstrate the high-performance of the system by reviewing several application examples on deformed alloys, ceramic and mineralogical samples.
Who Should Attend?
- Scientists and researchers interested in EDS/EBSD technologies for SEM.
- Experienced professionals managing resources in electron microscopy labs.
Speakers
Dr. Laurie Palasse
Global Application Manager, Bruker Nano Analytics
Dr. Meriem Ben Haj Slama
Application Scientist EBSD, Bruker Nano Analytics
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