An Introduction to micro-XRF on SEM
Increasing your SEM capabilities by augmentation with micro-XRF
The Scanning Electron Microscope (SEM) is a standard analytical tool in numerous fields. It is now possible to augment a SEM with the addition of a micro-XRF source in combination with an EDS detector, thus converting your SEM into a dual source system with additional analytical capabilities.
This webinar will provide an introduction to micro-XRF on SEM and show the increased capabilities it can bring to your SEM system across numerous analytical fields. This will include looking at various applications, including geology, mining, forensics, industrial, and semiconductors. The types of analysis covered will include point analysis, line scans and mapping, as well as how such XRF excitation analysis can be part of your routine workflow. In addition, our XTrace X-ray source, when combined with the Rapid Stage, allows Large Area Mapping of samples within the SEM chamber. Such capabilities highlight the power and versatility of augmenting a SEM with micro-XRF.
In this webinar we will demonstrate the benefits of increasing the analytical capabilities of a SEM by the addition of a micro-XRF source, with examples across a wide range of applications, incorporating both element distribution mapping as well as quantification, including of trace elements. The webinar will also include a short demo of operating the micro-XRF source using Bruker´s software suite ESPRIT.
Who Should Attend?
- All SEM users across all applications
If you found this webinar insightful we encourage you to watch our other “Back to the Roots” micro-XRF Webinars:
If you found this webinar insightful we encourage you to watch our other “Back to the Roots” micro-XRF Webinars:
- Watch on Demand: Back to the Roots Part I - Introducing micro-XRF as an Analytical Technique
- Watch on Demand: Back to the Roots Part II - Using micro-XRF for Qualitative Analysis
- Watch on Demand: Back to the Roots Part III - Using micro-XRF for Quantitative Analysis
- Watch on Demand: Back to the Roots Part V - Advantages of Standard-Supported micro-XRF Quantification
Speakers
Dr. Andrew Menzies
Senior Application Scientist - Geology and Mining, Bruker Nano Analytics
Stephan Boehm
Product Manager - micro-XRF on SEM and WDS, Bruker Nano Analytics
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