EMC2024 - European Microscopy Congress

Join Bruker at the European Microscopy Conference 2024 in Copenhagen to discover more about our analytical tools for microscopists in the material and life sciences. 

Bruker's systems enhance electron microscopes with the ability to carry out elemental and microstructural mapping, helping researchers to understand their samples more deeply.

The Bruker portfolio for electron microscopes includes systems for EDS, EBSD, WDS and micro-XRF on SEM. These systems are applied in a wide range of applications - from the semiconductor and battery industries to life science research.

In addition, Bruker also provides tools for nanomechanical testing and atomic force microscopes (AFM) for nanoscale imaging. This range includes systems for the AFM of biological samples, which can be used for molecular and cellular mapping at high-resolutions, facilitating the study of dynamic biological processes.   

Visit Bruker at EMC2024 at Booth B8 to find out more about how our microscopy solutions can help you take your research to the next level. 

Bruker Nano Analytics is excited to offer visitors to EMC2024 live demos on their electron microscope analyzer range.

Book a demo in advance to discover how Bruker's solutions can be used to map the elements in your samples, including live element mapping and trace detection, and for the determination of a material's microstructure. 

Dr. Daniel Goran will be hosting a pre-conference workshop on the latest advancements in on-axis Transmission Kikuchi Diffraction (TKD) as well as sample preparation techniques for large-area analysis. 

In this workshop users will discover: 

• How to prepare electron-transparent samples with the optimum characteristics for TKD analysis.
• How TKD can provide quantitative and qualitative data on crystallographic orientation down to 2 nm spatial resolution.
• The advantages of on-axis TKD for the crystallographic orientation mapping of nanomaterials in a SEM.

This workshop will be taking place on Sunday August 25 from 11:00 - 15:00. More details can be found on the EMC2024 website. 

Bruker Nano Analytics is excited to be hosting a presentation with Delong Instruments on elemental analysis using electron microscopes.

Discover in this live demo how our electron microscope analyzer range can be used to deliver elemental mapping to your SEM, TEM or STEM. 

• When: Wednesday August 28 - 16:30 
• Where: Bruker Booth B8, followed by a live demo at the Delong Instruments Booth C9

• Dr. Igor Németh will present the use of an annual silicon drift detector in advanced SEM EDS applications. Learn how the latest advancements in detector technology enable EDS analysis of challenging samples, including semiconductors, batteries and biological materials. 
  • Session IM-05, n° 933, Monday and Tuesday, August 26 – 27, 16:00 – 18:30

• Dr. Meiken Falke will present the combination of large collection angle energy-dispersive X-ray spectroscopy (EDS) and transmission Kikuchi diffraction (TKD) in SEM for studying the element composition and crystallographic properties of various materials prepared as electron transparent specimens.
  •  Session IM-13, n° 1335, Monday and Tuesday, August 26 – 27, 16:00 – 18:30

• In cooperation with JEOL, Yohei Kojima will present how the W-SEM with a newly developed EBSD detector provides sufficient resolution to analyze grains at the micro and sub-micron scale. Visit the session and learn more. 
  • IM-04, n°786, Monday and Tuesday, August 26 – 27, 16:00-18:30

To book ane elemental analysis demo with Bruker Nano Analytics please fill out the form below indicating your preferred day for a demo.

For those who cannot make it we will will also be offering online demos after the conference. Please select the "online" option in the form below to request an online demo.