Micro-XRF Spectrometers

M4 TORNADO PLUS

Super-light Elements in micro-XRF

XRF Mapping Down to Carbon

He-Purge for Sensitive Samples

Carbon

Lowest detectable element

All elements starting from carbon can be measured

>6

mm

Depth of focus with AMS

The aperture management system (AMS) allows a sharp image on topographic samples

0.5-4.5

mm

Selectable collimator sizes

Four-position collimator changer on the additional tube

The Revolutionary Super-Light Element micro-XRF Scanner

With the newest model of Bruker's micro-XRF family, you can find out more about your sample than XRF ever showed you before.

With its super-light element detectors, the M4 TORNADO PLUS is the first micro-XRF scanner able to measure any element from carbon upwards. Additionally, the performance of all light elements is strongly increased.

On this instrument, Bruker introduced the patented aperture management system (AMS) that enhances the depth of focus of the polycapillary lens for sharper element mappings of uneven samples. The optional second X-ray source further extends the analytical capabilities with its four selectable spot sizes from 0.5 to 4.5 mm.

Lighter, Faster, Deeper.

The chamber of the M4 TORNADO family offers an option for He-flush. This increases the light-element performance while maintaining atmospheric pressure in the chamber. Light elements in biological or wet specimens can be analyzed without the need to freeze or dry the samples.

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M4 TORNADO PLUS: Super-Light Element micro-XRF spectrometer

Benefit from the PLUS in Analytical Performance

Measure solids, particles or liquids with all advantages the well-proven M4 TORNADO family has to offer
Extend your micro-XRF experience with the ability to record spectra, line scans and maps of the complete element range starting at carbon
Record and save a combination of optical image and full spectral information per pixel in a HyperMap data cube
Reduce your measurement time through the combination of the focused X-ray beam with two high-throughput super-light element SD detectors
Get fast quantification results with a configurable fundamental parameter routine or use Bruker's XMethod software for standard-supported, fully standard-based and layer thickness quantification
Map uneven samples at high depth of focus using the aperture management system (AMS)
Improve performance with upgrades and service packages throughout the whole lifetime of the instrument

See also the M4 TORNADO, Bruker's most versatile micro-XRF scanner

Application Examples

PCB of mobile phone

Elemental Distribution Analysis of Electronic Components

Microelectronic components are of increasing complexity. Therefore, analytical methods to approach these sort of samples need both, a high spatial resolution and the capability to look into the depth of the sample.

Glass fragments

Glass Finger Printing Analysis

Micro-XRF, as an analytical tool, combines several features which make it ideal for the investigation of forensic samples, such as glass. It provides information on elements down to the trace level, can be applied under ambient conditions and is non-destructive.

Light Element Sensitivity

The M4 TORNADO PLUS is a micro-XRF instrument designed for the detection of light elements. For all elements above and including oxygen (Z=8) it is well possible to use the signal for quantitative analysis.

Webinars

The M4 TORNADOPLUS, the latest member of the proven, market leading family of M4 TORNADO Micro-XRF analyzers.

ON-DEMAND SESSION - 60 MINUTES

M4 TORNADO PLUS - A New Era in Micro-XRF

Bruker invites you to get to know the M4 TORNADO PLUS Micro-XRF spectrometer and its broad range of applications.

Bruker's M4 TORNADO is a tabletop Micro-XRF spectrometer.

ON-DEMAND SESSION - 77 MINUTES

Explore Micro-XRF in the Geosciences

Explore the exciting world of micro-XRF for Geology and get questions on the method answered by leading Micro-XRF experts.

Micro-XRF spectrometry

ON-DEMAND SESSION - 63 MINUTES

Seeing the world through other eyes

Scanning micro-XRF has developed into a highly informative analytical tool for the study of complex samples across multiple disciplines.

Get back to the roots:

Explore the Fundamentals of micro-XRF

Part I: Introducing micro-XRF as an Analytical Technique

This webinar explores the potentials of micro-XRF as a technique for quantitative analysis. After covering the basics of the technique and the potentials of the qualitative and semi-quantitative analysis it is time for quantitative analysis to be in focus.

Part II: Using micro-XRF for Qualitative Analysis

This webinar takes a deeper look into micro-XRF, exploring the potential of micro-XRF as a technique for qualitative analysis using a variety of examples and case studies.

Part III: Using micro-XRF for Quantitative Analysis

This webinar explores the potentials of micro-XRF as a technique for quantitative analysis. After covering the basics of the technique and the potentials of the qualitative and semi-quantitative analysis it is time for quantitative analysis to be in focus.

Part IV: An Introduction to micro-XRF on SEM

This webinar demonstrates the benefits of having a micro-XRF source mounted on your SEM with examples from across a wide range of applications, incorporating both element distribution mapping as well as quantification, including trace elements.

Part V: Using micro-XRF for Quantitative Analysis

This webinar explores how fundamental parameter quantification can be used to carry out micro-XRF mapping and measurements with a high accuracy and how state-of-the-art FP quantification can be used to carry out standardless micro-XRF analysis that rivals standard-based measurements.

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