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Nanoscale Infrared Spectroscopy Webinars

Introduction to Nanoscale Infrared Spectroscopy and Imaging with Photothermal AFM-IR

Learn the working principles, benefits, and ideal applications of AFM-IR for nanochemical characterization


Obtain Chemical Information with Nanoscale Sensitivity and Resolution

Infrared (IR) spectroscopy is a common method for the chemical characterization of organic and inorganic materials, but traditional FTIR techniques are limited in resolution and sensitivity on the order of several microns. Photothermal AFM-IR (or just AFM-IR) uses an AFM probe to detect thermal expansion of a highly localized area of material, resulting in a lateral resolution 1000x better than traditional FTIR, <1 nm detection sensitivity, and model-free interpretation.

In this webinar, Bruker experts will:

  • Introduce the photothermal AFM-IR technique
  • Explore the simple mechanism underlying the technique
  • Highlight a few of AFM-IR’s many broad applications
  • Offer a demonstration of photothermal AFM-IR on the Dimension IconIR system


Thursday, October 17 | 8AM PDT | 11AM EDT | 5PM CEST

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Find out more about the technology featured in this webinar or our other solutions for nanoscale infrared spectroscopy:

Webinar Summary

Infrared (IR) spectroscopy is a commonly used characterization technique for organic materials and many inorganic compounds and crystals. While powerful, it is limited by the diffraction limit to resolution on the order of several microns, and the lateral resolution is strongly dependent on the wavelength.

Photothermal AFM-IR is a novel technique which offers IR spectroscopy and imaging on materials with a lateral resolution 1000x better than traditional FTIR and <1 nm detection sensitivity with model-free interpretation. AFM-IR achieves this by using an AFM probe as the detector of photothermal expansion. This opens a variety of applications on both organic and inorganic materials where nanometer sensitivity and resolution are key.

In this webinar, Bruker experts will introduce the photothermal AFM-IR technique in depth, from working principles to applications, ending with a demonstration on the Dimension IconIR system. 

Date: Thursday, October 17
Time:  8AM PDT | 11AM EDT | 5PM CEST
Location: Online
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Speaker(s)

Peter De Wolf, Ph.D.,

Director of Technology & Application Development

Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.

Cassandra Phillips, Ph.D.
Application Scientist, Bruker

Cassandra did her Ph.D. at the University of Toronto exploring the photophysics of boron nitride nanotubes using scattering scanning nearfield optical microscopy (s-SNOM) and computational models. She has been working at Bruker Nano Surfaces and Metrology since September 2019 as an Applications Scientist focusing on nanoscale IR spectro-microscopy and other correlated imaging techniques realized with atomic force microscopy.

Dr. Qichi Hu, Senior Applications Scientist

Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.

Past Webinars