生产CO₂低温颗粒(CO₂ Cryogenic Particle)去除污染
EL-C®系统广泛适用于各种应用场景,包括清除生产及处理过程中沉积在上表面和背面的颗粒,尤其适合清楚由其他设备引入的颗粒污染物。EL-C® 采用干式清洁方法,全程无污染。光罩可根据需要进行多次清洁,对直径小至50nm的软颗粒实现100%的彻底清除能效。
在光罩的生产制造和曝光处理过程中,未知颗粒的污染持续困扰着先进节点的光罩使用。而随着光罩材料变得越来越复杂,关键尺寸不断缩小,高效、无损的清洁技术变得日益重要。
数年前,布鲁克推出了全新的光罩清洁选择——Extreme Lithography Cleaner (EL-C®) 低温干洗系统。与传统清洁技术相比,该系统不仅显著提升了软颗粒的清除效率,还极大减少了对特征结构的损害及表面再污染的风险。如今,EL-C®系统已被广泛应用于全球各个晶圆及光罩厂,助力企业实现更高标准的质量控制与生产效率。
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