Resonance Enhanced Force Volume AFM-IR: A Powerful New Technique for Nanoscale IR Characterization
Learn about the Latest Nanoscale IR Characterization Technique:
REFV AFM-IR
Highlights of this webinar include:
- Introduction to the REFV AFM-IR technique
- Outline of performing simultaneous multimodal imaging and spectroscopy
- Introduction to new mechanical tracking methods
- New applications offered by REFV AFM-IR
- Demonstration of the technique
- Q&A session - don’t miss the opportunity to pose your questions to our NanoIR experts
Webinar Summary
Nanoscale infrared microscopy enables label-free, chemical imaging and spectroscopy at the nanometer scale by combining atomic force microscopy (AFM) with infrared radiation. Over the years, different AFM-IR modes have been developed: The original photothermal-induced resonance enhanced mode and surface sensitive AFM-IR are based on contact mode, while Tapping AFM-IR is built on tapping mode. All of these nanoIR variations, however, have the inherent advantages and limitations of their respective AFM base mode.
Resonance Enhanced Force Volume (REFV) AFM-IR is a novel approach that relies on off-resonance tapping to simultaneously capture nanomechanical and nanochemical properties and deliver previously inaccessible insights into material properties.
Find out more about the technology featured in this webinar or our other solutions for nanoscale IR characterization:
Featured Products and Technology
Speakers
Peter De Wolf, Ph.D.,
Director of Technology & Application Development
Cassandra Phillips, Ph.D.
Application Scientist, Bruker
Dr. Qichi Hu, Senior Applications Scientist
