Dimension FastScan AFM

Dimension FastScan

The Dimension FastScan^® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

No-compromise

high-speed performance

Delivers highest resolution any time, every time, independent of sample size.

Real-time

nanoscale dynamics

Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.

Automated

setup, data acquisition, and analysis

Makes system operation surprisingly simple while enhancing productivity, allowing you to focus on your research.

Download Brochure

Features

Benchmark for High Speed and High Resolution

Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping^®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

Point defect resolution stiffness image of calcite. 15 nm image size (Panel 1). Submolecular resolution adhesion image of iPMMA film. 100 nm image size (Panel 2). Sample courtesy of Prof. Dr. Thurn-Albrecht, Martin-Luther-Universität Halle-Wittenberg.

Exceptional Productivity

Completely unattended, automated, fully self-optimizing imaging of six different samples within ten minutes, yielding publication-quality results in each case.

Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

More Applications and New Insights Faster

Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

Investigate forces driving wetting and de-wetting on polystyrene films (<100nm thick) on hydrophobically treated silicon surfaces.

Amorphous drug formulations study, capturing 60 sites in 60 minutes. Samples courtesy M. E. Lauer, O. Grassmann, F. Hoffmann-LaRoche, Basel, Switzerland.

Powered by the NanoScope 6 AFM Controller

Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.

NanoScope 6 uniquely enables Bruker AFMs to:

Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.

NanoScope 6 Controller

Leading-edge AFM controller built on an innovative high-speed, low-noise architecture for delivering unprecedented measurement performance

Contact us to discuss your measurement requirements, the systems best-suited to your applications, and options for system specialization, or submit a sample run request to validate that a Bruker AFM will meet your specific needs.

Bruker AFM Sample Run Request

AFM Modes

Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

Learn More About AFM Modes

Dimension FastScan Data Gallery

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.

To maximize lateral resolution, stay close but not too close. PeakForce Tapping uniquely allows you to do this. See Physical Review B 56(7), 4159, 1992, and Chemical Review 88, 927 (1988) for the detailed modeling of the tip-sample interaction.

PeakForce QNM modulus images of graphene on hexagonal boron nitride, revealing a transition to a commensurate lattice upon alignment with highly localized strain relief. See also Nature Physics 10, 451–456 (2014).

Angstrom-level roughness measurements across an entire wafer. 96 measurements within 2 hours.

Increase scan speed on even the high-resolution Icon head with Fast Tapping.

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.

Current imaging on vertically standing carbon nanotubes. Only possible with PeakForce TUNA.

Left: Atomic-scale force cube with PeakForce Capture showing the positions of individual atoms in a vertical (XZ) cut. Right: Averaged PeakForce Capture data showing evidence of solvent structure.

PeakForce Tapping height images (left) and force curves (right) showing the difference in surface atom arrangement and atomic scale tip-sample interaction between calcite and mica.

C36H74 alkane on HOPG.

FastScan supports Bruker’s patent-pending PeakForce QNM Imaging Mode with the Icon Scanner, and nano-mechanical mapping with the FastScanner. With this technology, researchers can now map and distinguish quanitatively or relatively at high scan rates between nanomechanical properties while simultaneously imaging sample topography at high resolution.

1 second with Dimension FastScan AFM. DNA on Mica in Fluid (Prep by APS Method). Sample courtesy of Y. Lyubchenko, Univ. of Nebraska Med. Ctr.

Carry out electrical characterization at the nanoscale with Bruker-proprietary AFM modes for greater sensitivity, resolution, and dynamic range. PeakForce TUNA and PeakForce SSRM provide unique electrical characterization capability while simultaneously providing correlated mechanical property information on the same sample location.

Perform manipulation and lithography at the nanometer and molecular scales. The XYZ closed-loop Icon scanner provides precise probe positioning with no piezo creep and extremely low-noise for the best positioning of any available nanomanipulation system.

Heating and Cooling Execute temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes. Alternately, perform sub-100nm-node heating with the scanning probe up to 500°C.

Range of AFM imaging modes and techniques performed on a graphene flake, including adhesion, modulus, deformation, and topography.

Accessories

Enhance Your Bruker AFM

Bruker AFM Probes

Find a wide variety of AFM probes, cantilevers and accessories in our online store. Our AFM expertise is built into every probe!

AutoMET Software

Enhanced nanoscale automation for Dimension systems

Recent AFM Webinars

Testimonials

Hear What Our Customers Have to Say

We have been using the Bruker Fastscan AFM for more than two years. In our experience, Fastscan images four to five times faster without degrading resolution compared to other AFMs. In addition, ScanAsyst mode with intelligent auto scan parameter adjustment enables us to quickly scan many samples with ease. The superior Fastscan AFM performance has advanced our group’s reputation with many publications in DNA nanotechnology research.

Dr. Shou-Jun Xiao, Nanjing University, Nanjing China

More Information

Contact Expert

Contact Us About the Dimension FastScan AFM

Request Info or Contact Sales

Find Service/Support Near You

Topic Input value is invalid.

_{* Please fill out the mandatory fields.}

First Name Please enter your first name

Last Name Please enter your last name

Email Please enter your e-mail address

Company/Institution Please enter your Company/Institution

Country or Area Please select your Country

State/Province Please select your State

What best describes your current interest? required

INFO: This Form Sections dropdown won't be visible on publish due to only 1 selectable option.

Phone Number Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Phone Number Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Phone Number Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Phone Number Please enter a valid phone number

ⓘ Used to provide a faster response to your request/question.

Request - Please be specific:

Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.

Opt-in

By submitting this form I confirm that I would like to be contacted by Bruker. I have taken note of the Bruker Website Privacy Notice and I agree to the Terms of Use of the Bruker website. Please accept the Terms and Conditions

^{Privacy Notice Terms of Use}