XRM

3D XRM for Material Science

Bruker’s portfolio of 3D X-ray microscopes (XRM) offers turnkey solutions for non-destructive 3D imaging of a wide variety of industrial and scientific applications. This includes defect detection in casting, machining and additive manufacturing, inspection of complex electro-mechanical assemblies, pharmaceutical packaging, advanced medical tools, porosity and grain size analysis in geological samples, and in-situ microscopy.

A new dimension for microscopy

Bruker 3D X-ray Microscopes (XRM) combine micro-computed tomography (micro-ct) hardware with specialized software into a complete microscopic visualization solution. Ranging from micro-resolution benchtops to nano-resolution floor standing instruments, Bruker XRM solutions provide the perfect balance of ease-of-use and power.

From measuring the porosity in geological specimens to the thickness of multiple coatings on pharmaceutical tablets or the on-chip and board level interconnect structure of circuits, XRM allows rapid multiscale analysis. The non-destructive nature of XRM allows validation of component integrity bringing QC of manufacturing techniques such as additive manufacturing to a new level.

Bruker’s software provides simple push button interfaces for technicians and novice researchers and exceptional depth for experts looking to push the boundaries of their samples and the technique. Reconstruction is accomplished with the latest GPU driven algorithms providing results from large datasets in a fraction of the time. The included analysis package allows both qualitative visualizations and quantitative regressions.

Which XRM is right for you?

Materials Science XRM Specifications

Specification	SKYSCAN 1275	SKYSCAN 1272 CMOS	SKYSCAN 1273	SKYSCAN 2214 CMOS
Exterior dimensions (w x d x h, mm)	1040 x 665 x 400	1160 x 520 x 330	1250 x 820 x 815	1800 x 950 x 1680
Weight (without optional electronics)	170 kg	150 kg	400 kg	1500 kg
Source	40-100 kV	40-100 kV	40-130 kV	20-160 kV
Detector	3 Mp Flat Panel	16 Mp CMOS	6 Mp Flat Panel	6 Mp Flat Panel 16 Mp large CMOS 16 Mp mid CMOS 15 Mp hi-res CMOS
Max Sample Size (Diam, Height)	96 mm, 120 mm	75 mm, 80 mm	300 mm, 500 mm	300 mm, 400 mm
Minimum Resolution (Voxel, Spatial)	<4 µm, <8 µm	<0.45 µm, <5 µm	<3 µm, <6 µm	60 nm, <500 nm
Measurement, Reconstruction and Analysis Software	Included	Included	Included	Included

POSITION, SCAN, RECONSTRUCT…

Position

Real time view of the sample and actively updated default scan parameters allow fast scan setup.

Scan

Radiographs can be seen in real time allowing measurement monitoring. Measurements can be batched to ensure full system utilization.

NRECON

GPU driven, cutting edge algorithm results in 3D model reconstruction in a fraction of the traditional computing time.

… and ANALYZE

DATAVIEWER

Display reconstructed results as slice-by-slice movies or three orthogonal projections.

CTVOX and CTVOL

Volume rendering to explore the 3D interior with cross sectioning and fly through. Surface rendering to generate models in stl format for export to CAD and 3D printers.

CTAN

Quantitative analysis for density, porosity, distances, angles, thickness, separation and advanced visualization built on a robust automatable platform.

XRM Facility in Belgium and our Virtual Showroom

Visit the demo facilities in our headquarters in Karlsruhe (Germany) and Kontich (Belgium) or just take a virtual tour in our showrooms to see and learn more about our analytical solutions. If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.

XRM
Bruker Belgium
Kartuizersweg 3B,
2550 Kontich, Belgium