Dimension Icon Upgrade and Add-On Options
Stay at the Forefront of Your Field with Unmatched Upgradability
The Dimension Icon AFM can be easily custom-configured with different upgrade and add-on options to meet diverse measurement requirements. These modular hardware and software upgrades can be added to your system on-site to enable the highest performance and latest techniques on even the most challenging samples. Continue reading to learn more about a selection of popular upgrades and mode add-ons and contact us for more information about Bruker's many other extension options.
Make Your Icon 5 to 100x Faster with a FastScan Head Upgrade
Benefit from the expanded capabilities of two distinct AFMs on one Dimension platform utilizing the modular architecture of Icon and FastScan heads. With this upgrade, the Icon head can be easily exchanged with the FastScan head, dramatically increasing productivity and enabling new insights with:
- The ultimate tip-scanning speed and stability for direct visualization of nanoscale dynamics in air and fluid;
- Frame-per-second imaging rates independent of sample size with automated setup, acquisition, and analysis; and
- Simple and streamlined return to Icon head for utmost flexibility.
Use the FastScan head to:
- Explore the heterogeneity, unique feature characteristics, and mechanical properties of unknown samples.
- Gain immediate feedback for failure analysis and nanoscale quality control.
- Directly visualize nanoscale dynamics in air and fluid.
Drive Advanced Research with a NanoScope 6 Controller Upgrade
Bruker's latest-generation NanoScope controller delivers ultimate ease of use without compromising function or flexibility. It delivers high speeds, low noise, and exceptional mode compatibility to significantly enhance the performance of Dimension Icon AFMs in nearly every application.
Upgrade to the NanoScope 6 controller to:
- Optimize high-speed tapping imaging with 75% signal-to-noise improvement in TappingMode at 2 MHz.
- Use our next-generation PeakForce Tapping with variable rate and 10 MHz sampling for high-speed detail.
- Collect conductive measurements in STM, C-AFM, and TUNA with 10 MHz sampling, higher bit resolution, and improved low-current performance.
- Characterize ferroelectrics with 5x lower background noise in PFM for reliable quantification and superior sensitivity.
Expand Your Research with New AFM Modes
Bruker AFMs boast the largest selection of measurement and imaging modes in the industry, including a variety of first-and-only modes — such as the PeakForce Tapping family — that have enabled an unmatched publication impact. We also regularly develop new, innovative modes to support leading-edge research across a range of research applications.
Dimension Icon users can significantly broaden the capabilities of their existing AFM systems with new and optional mode add-ons, including modes to:
Fully characterize semiconductor and functional materials
- PeakForce TUNA – Probe conductivity even on fragile samples (e.g., polymers and nanowires).
- DataCube modes – Collect and analyze hyperspectral datasets.
- SS-PFM – Achieve highly accurate nanoscale characterization of ferroelectrics.
Quantify nanomechanics for any application
- PeakForce QNM – Acquire out-of-the-box quantitative modulus.
- AFM-nDMA – Create full polymer master curves and quantify viscoelasticity.
- FASTForce Volume CR – Obtain complete hard-matter mechanics data.
Enhance battery research
- Electrochemical AFM – Observe model systems for battery electrodes.
- PeakForce SECM – Map local nanoscale electrochemical activity.