Dimension Nexus
Dimension Nexus ™は、業界をリードするimension® 原子間力顕微鏡(AFM)製品ラインの最新製品として、データ品質、計測の柔軟性、使いやすさをコンパクトなシステムで実現しました。
ブルカーのNanoScope® 6 コントローラとPeakForce Tapping® テクノロジーの画期的なイノベーションを搭載し、同クラスの市販システムと比べ最も多くの拡張機能を備えた柔軟性を提供します。共同利用機器施設、学術研究グループ、R&D ラボ、産業分野等、様々な研究活動に貢献します。
測定結果に表れるクラス最高性能
Dimension Nexus は、分子レベルから原子レベルの分解能を達成し、高精度で再現性の高い計測を実現します。
クラス最高性能
最先端のハードウェア、ソフトウェア、専用AFM プローブの組み合わせにより、Nexus は、研究および産業における幅広い種類のサンプルに対して、クラス最高の性能を提供します。:
さまざまな試料に対して最高分解能のイメージングと定量的な機械的、電気的、化学的性質のマッピングを行うための、PeakForce Tapping モードのフルセット
最高速度、低ノイズ、多様なAFMモードをサポートする最新世代のNanoScope 6コントローラ
花崗岩製ベース上にドリフトを低減する頑丈なブリッジ構造に取り付けられ、一体化された卓上防音エンクロージャによって周辺音から遮断性を確保したクローズドループXYZ スキャナ
特定の測定モードや試料に対応するAFM専用プローブの幅広いラインナップを用意
測定品質の安定性を確保
長期間にわたってイメージングを行う場合、Dimension Nexusはドリフトを最小限に抑え、長距離スキャンにおいても、システムにはスキャナーアーティファクトやチップの劣化は見られません。
左上図：SAA-HPIプローブを使用し、PeakForce Tappingで90 x 2 μmスキャン（16384 x16 px）した360本のトレンチのアレイ（見開きページにまたがる）。クリティカルディメンション解析では、全範囲にわたってスキャナのアーチファクトやチップの劣化は見られなかった。
左図：360本のトレンチすべてにわたるトレンチ間ピッチ測定。全スキャン範囲にわたって偏差がほぼゼロであることがわかる。90 μm画像の両端から1.6 μm画像を拡大
優れた機能と使いやすさを実現
Nexus provides distinct advantages for researchers with early-stage labs or future plans to expand their AFM research:
The base configuration with programmable stage for high-throughput, multi-site measurements rapidly delivers high-quality data to address standard applications.
Operators of all experience levels can produce reliable results with ease-of-use features, such as streamlined sample/probe setup, ScanAsyst self-optimizing imaging, and advanced data analysis software.
Extensive upgrade options — unique operating modes, reliable environmental control, and powerful software integrations — ensure the system can grow with your research.
Offers Future Versatility and Customization
In addition to being upgradable, Dimension Nexus is open-access to facilitate experiment customization. There is physically open access to the probe-sample junction, accommodating electrical connection attachments and other custom accessories. The NanoScope 6 controller also provides an open hardware and software platform with front-panel BNC connectors, scripting software options, and easy data import to Python for custom analyses.
Enables Full Range of Applications
With a 150 mm open-access programmable stage, compatibility with majority of Bruker's 50+ modes including full PeakForce Tapping capabilities, fluid imaging, environmental control, and more, Nexus delivers affordable AFM excellence for a wide range of applications and experiments, including:
- Mapping nanomechanical properties of polymers and composite materials
- Characterizing graphene, moiré superlattices, and other 2D materials at the nanoscale
- Correlating structural and ferroelectric properties of perovskites in photovoltaics
- Conducting in-situ and operando studies of the local electrochemical activity of lithium-ion batteries
- Quantifying nanoscale surface roughness of semiconductor thin films and substrates
- Manipulating and characterizing the electrical properties of DNA nanowires for nanoelectronic devices
Contact us to discuss your measurement requirements and options for system specialization, or submit a sample run request to learn how a Bruker AFM is best suited for your applications.
Dimension Nexus Select Specifications
| X-Y Scan Range | 90 μm x 90 μm typical, 85 μm minimum |
| Z Range | 10 μm typical in imaging and force curve modes, 9.5 μm minimum |
| Sample Size/Holder | 150 mm vacuum chuck for samples, ≤150 mm diameter, ≤15 mm thick |
| Motorized Positioning (XY Stage) | 150 mm x 150 mm inspectable area; 6 μm repeatability, bidirectional; programmable for multi-site measurements |
| Microscope Optics | 5 MP digital camera; 180 μm to 1465 μm viewing area; digital zoom and motorized focus |
| Certification | CE |
| Download the brochure for full specs list |
What Dimension AFM Is Right For You?
Bruker offers an expansive selection of high-quality AFM systems. Our Dimension AFMs feature industry-leading nanoscale imaging and characterization technologies built on decades of AFM experience and with constant collaboration with customers. Dimension Icon, our flagship product, sets the highest possible standard for the entire market of commercial AFMs. Dimension Nexus now joins the line to provide excellent value and performance in a cost-effective AFM.
Scroll down to see an overview of the differences in key features and capabilities between these two best-in-class systems.
Key features and specs
| Dimension Nexus |
Dimension Icon | |
| Sample Size (XY) | 150 mm | 300 mm |
| Motorized Stage Range | 150 mm x 150 mm | 150 mm x 180 mm |
| Small & Multi-Sample Compatibility | Yes | Yes |
| Sample Flexibility | Tip Scanner | Tip Scanner |
| XY-Scan Range | 90 µm x 90 µm | 90 µm x 90 µm |
| Z-Range | 10 µm | 10 µm |
| System Footprint (W x L) | 24" x 32" (plus customer desk/workstation) | 47" x 94" (including integrated workstation) |
| Controller | NanoScope 6 | NanoScope 6 |
| Programmable Measurements | Yes | Yes |
| Automated Metrology Recipes | No | Yes |
| Open-Access Platform | High degree of flexibility for customization | Maximum flexibility for customization |
Measurement capabilities
| Dimension Nexus | Dimension Icon | |
| High-Resolution Imaging | Atomic lattice resolution | Atomic defect resolution |
| High-Speed Imaging | Fast Tapping | FastScan dedicated high-speed AFM; Fast Tapping |
| PeakForce Tapping | Yes | Yes |
| ScanAsyst (Self-Optimizing Imaging) | Yes | Yes |
| PeakForce Tapping Derivative Modes* | Yes | Yes |
| Chemical Identification Capability | No | IconIR upgradable |
| Hyperspectral Imaging | DataCube | DataCube |
| Other Modes & Options* | Wide range to address majority of applications | Complete range for industry-leading application coverage |
| * Contact us or download the brochure to see the full modes list |
Powered by the NanoScope 6 AFM Controller
Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.
NanoScope 6 uniquely enables Bruker AFMs to:
- Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis
- Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application
- Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.