Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value
Empowering researchers with any application or budget to begin and expand their AFM studies
In this webinar, Bruker atomic force microscopy experts present the latest addition to Bruker’s industry-leading Dimension atomic force microscope product line—Dimension Nexus.
Nexus delivers an ideal combination of data quality, experiment flexibility, and ease of use in a small-footprint system. It incorporates the milestone innovations of Bruker's NanoScope 6 controller and PeakForce Tapping technology to deliver more functionality than competing systems in its class.
Watch this on-demand webinar to hear how only Dimension Nexus:
- Provides ultimate versatility and value with an expansive quite of available AFM modes and scripting capabilities.
- Enables accurate, repeatable metrology and class-leading performance for atomic- to molecular-resolution imaging.
- Boosts productivity with a programmable, motorized stage on a compact system for high-throughput and publication-ready results every time.
Find out more about the technology featured in this webinar or our other solutions for AFM:
Featured Products and Technology
Guest Speaker
Bede Pittenger, Ph.D., Sr. Staff Development Scientist, AFM Applications, Bruker Nano Surfaces
Dr. Bede Pittenger is a Senior Staff Development Scientist in the AFM Unit of Bruker's Nano Surfaces Business. He received his PhD in Physics from the University of Washington (Seattle, WA) in 2000, but has worked with scanning probe microscopes for 25 years, building systems, developing techniques, and studying properties of materials at the nanoscale. His work includes more than thirty publications and three patents on various techniques and applications of scanning probe microscopy. Dr. Pittenger's interests span topics from interfacial melting of ice, to mechanobiology of cells and tissues, to the nanomechanics of polymers and composites.
Peter De Wolf, Ph.D., Director of Technology & Application Development
Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.
Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker Nano Surfaces & Metrology
Dr. Andrea Slade received her Ph.D. in Biochemistry / Biomedical Engineering from the University of Toronto on the integration of AFM with optical microscopy for the study of biological membranes and membrane-protein interactions. Since joining Bruker in 2005, her work has covered a range of applications and markets, from life science to materials research and semi-conductor industries. Andrea has over 25 years of experience in AFM, numerous peer-reviewed publications, and has given seminars and presentations worldwide.
Khaled Kaja, Ph.D., Applications Scientist
Dr. Khaled Kaja holds a PhD in Nanophysics from the University of Grenoble. He started his research journey at the Leti laboratory (French commission of atomic and alternative energies, CEA) working on the development of highly-resolved nanoelectrical AFM measurements. Following a post-doctoral training at the Swiss federal institute (ETH) Zurich under the chair of nanotechnology (Prof. Dr. Andreas Stemmer), he moved to the UK joining Bruker nano surfaces as an applications scientist. In 2017, Dr. Kaja moved to the middle east as an assistant professor of physics at different universities in the region. Later in 2020, he joined the French national metrology lab (LNE) as a research scientist working on the development of nanoelectrical metrology. Recently, Dr. Kaja joined Bruker nano surfaces and metrology in Karlsruhe (Germany) as an applications scientist. His main research interests are focused on the development of novel nanoelectrical AFM methods applied to 2D materials and low dimensional systems.