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▶ Watch On-Demand | 1 HR 6 minutes
On-Demand Session: Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value
Discover how Dimension Nexus can revolutionize your research
Watch Now | 8 Minutes
Dimension Nexus Product Introduction
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Presented by Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Latest Addition to the Dimension Product Family
[00:00:50]
PeakForce Tapping overview
[00:02:58]
AFM modes available
[00:04:18]
Large-sample capabilities of the Nexus
[00:06:15]
Features of the Nexus
Watch Now | 13 Minutes
Case Study 1: High Performance Topographic Imaging
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Presented by Peter De Wolf, Ph.D., Director of Technology and Application Development, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:22]
Tapping Mode on PTFE crystal lattice
[00:01:11]
Tapping Mode on Patterned Sapphire Substrate (PSS) for LED
[00:02:30]
Tapping on SBC Polymer & Celgard
[00:04:13]
TR-DFM on 2D with Moire Pattern
[00:05:12]
PeakForce Tapping on SiO
2
6" Wafer
[00:06:45]
PeakForce Tapping for Lifescience
[00:07:41]
PeakForce QNM on SBC Block Copolymer and on PS-PMMA-PVC blend
[00:09:02]
PeakForce Tapping on NanoPillars
[00:09:58]
PeakForce Tapping on Trenches
Watch Now | 17 Minutes
Case Study 2: Nanoelectrical Characterization
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Presented by Khaled Kaja, Ph.D., Applications Scientist, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Kelvin Probe Force Microscopy: a suite of implementations
[00:01:56]
FM-KPFM on hBN: high spatial resolution and sensitivity
[00:03:28]
PF FM-KPFM on hBN: Probing the capacitance variations
[00:06:47]
Piezo Force Microscopy (PFM): single crystal lead PMN-PT
[00:08:18]
DataCube Contact Resonance PFM: follow the peak
[00:12:40]
PeakForce Magnetic Force Microscopy (PF MFM)
[00:15:48]
Tip scanning advantage: external implementations for advanced instrumentation measurements
Watch Now | 20 Minutes
Live Demonstration: Dimension Nexus
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Presented by Bede Pinttenger, Ph.D, Sr. Staff Development Scientist, AFM Applications, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Quick overview of the Nexus
[00:01:15]
Scan assist software overview
[00:02:54]
Tapping mode demo
[00:05:08]
PeakForce Tapping/scanassist+ demo
[00:08:05]
Automation on dimension microscopes
[00:17:09]
Scan results
[00:19:02]
Q&A
Watch Now | 8 Minutes
Question and Answer
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PRESENTATION HIGHLIGHTS:
[00:00:00]
What is the main difference between the Icon and the Nexus?
[00:01:00]
What kind of application modules can be used with Nexus?
[00:02:21]
What kind of FastScan capabilities does the nexus have?
[00:03:21]
What is the sampling frequency on the nano scope six controller?
[00:04:20]
Is there a heating stage available, like for PIO electrics?
[00:05:00]
Is it possible to change the ICON Scanner Head into the Dimension Nexus system?
[00:06:10]
Conclusion
Featured Products and Technology
Dimension Nexus AFM
Redefining the quintessential value AFM with highest performance in its class
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NanoScope 6 Controller
Leading-edge AFM controller built on an innovative high-speed, low-noise architecture for delivering unprecedented measurement performance
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AFMs for Materials
Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
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