▶ Watch On-Demand | 1 HR 6 minutes

On-Demand Session: Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value

Discover how Dimension Nexus can revolutionize your research
Watch Now | 8 Minutes

Dimension Nexus Product Introduction

Presented by Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker

       PRESENTATION HIGHLIGHTS:

  • [00:00:00] Latest Addition to the Dimension Product Family
  • [00:00:50] PeakForce Tapping overview
  • [00:02:58] AFM modes available
  • [00:04:18] Large-sample capabilities of the Nexus
  • [00:06:15] Features of the Nexus
Watch Now | 13 Minutes

Case Study 1: High Performance Topographic Imaging

Presented by Peter De Wolf, Ph.D., Director of Technology and Application Development, Bruker

       PRESENTATION HIGHLIGHTS:

  • [00:00:22] Tapping Mode on PTFE crystal lattice
  • [00:01:11] Tapping Mode on Patterned Sapphire Substrate (PSS) for LED
  • [00:02:30] Tapping on SBC Polymer & Celgard
  • [00:04:13] TR-DFM on 2D with Moire Pattern
  • [00:05:12] PeakForce Tapping on SiO26" Wafer
  • [00:06:45] PeakForce Tapping for Lifescience
  • [00:07:41] PeakForce QNM on SBC Block Copolymer and on PS-PMMA-PVC blend
  • [00:09:02] PeakForce Tapping on NanoPillars
  • [00:09:58] PeakForce Tapping on Trenches
Watch Now | 17 Minutes

Case Study 2: Nanoelectrical Characterization

Presented by Khaled Kaja, Ph.D., Applications Scientist, Bruker

       PRESENTATION HIGHLIGHTS:

  • [00:00:00] Kelvin Probe Force Microscopy: a suite of implementations
  • [00:01:56] FM-KPFM on hBN: high spatial resolution and sensitivity
  • [00:03:28] PF FM-KPFM on hBN: Probing the capacitance variations
  • [00:06:47] Piezo Force Microscopy (PFM): single crystal lead PMN-PT
  • [00:08:18] DataCube Contact Resonance PFM: follow the peak
  • [00:12:40] PeakForce Magnetic Force Microscopy (PF MFM)
  • [00:15:48] Tip scanning advantage: external implementations for advanced instrumentation measurements
Watch Now | 20 Minutes

Live Demonstration: Dimension Nexus

Presented by Bede Pinttenger, Ph.D, Sr. Staff Development Scientist, AFM Applications, Bruker

       PRESENTATION HIGHLIGHTS:

  • [00:00:00] Quick overview of the Nexus
  • [00:01:15] Scan assist software overview
  • [00:02:54] Tapping mode demo
  • [00:05:08] PeakForce Tapping/scanassist+ demo
  • [00:08:05] Automation on dimension microscopes
  • [00:17:09] Scan results
  • [00:19:02] Q&A
Watch Now | 8 Minutes

Question and Answer

       PRESENTATION HIGHLIGHTS:

  • [00:00:00] What is the main difference between the Icon and the Nexus?
  • [00:01:00] What kind of application modules can be used with Nexus?
  • [00:02:21] What kind of FastScan capabilities does the nexus have?
  • [00:03:21] What is the sampling frequency on the nano scope six controller?
  • [00:04:20] Is there a heating stage available, like for PIO electrics?
  • [00:05:00] Is it possible to change the ICON Scanner Head into the Dimension Nexus system?
  • [00:06:10] Conclusion