FR
My Bruker
Contacter l'expert
Produits & solutions
Applications
Prestations de service
Nouveautés & événements
À propos
Carrières
Veuillez utiliser au moins 2 caractères (vous utilisez actuellement 1 caractère).
Languages
Deutsch
English
Español
Français
Italiano
Polski
Português
Русский
中文
日本語
한국어
▶ Watch On-Demand | 1 HR 6 minutes
On-Demand Session: Dimension Nexus AFM: The Intersection of High Performance and Unbeatable Value
Discover how Dimension Nexus can revolutionize your research
Watch Now | 8 Minutes
Dimension Nexus Product Introduction
Vous devez accepter les cookies pour lire cette video.
Paramètres des cookies
Presented by Andrea Slade, Ph.D., Product Manager, Materials AFM, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Latest Addition to the Dimension Product Family
[00:00:50]
PeakForce Tapping overview
[00:02:58]
AFM modes available
[00:04:18]
Large-sample capabilities of the Nexus
[00:06:15]
Features of the Nexus
Watch Now | 13 Minutes
Case Study 1: High Performance Topographic Imaging
Vous devez accepter les cookies pour lire cette video.
Paramètres des cookies
Presented by Peter De Wolf, Ph.D., Director of Technology and Application Development, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:22]
Tapping Mode on PTFE crystal lattice
[00:01:11]
Tapping Mode on Patterned Sapphire Substrate (PSS) for LED
[00:02:30]
Tapping on SBC Polymer & Celgard
[00:04:13]
TR-DFM on 2D with Moire Pattern
[00:05:12]
PeakForce Tapping on SiO
2
6" Wafer
[00:06:45]
PeakForce Tapping for life science applications
[00:07:41]
PeakForce QNM on SBC Block Copolymer and on PS-PMMA-PVC blend
[00:09:02]
PeakForce Tapping on NanoPillars
[00:09:58]
PeakForce Tapping on Trenches
Watch Now | 17 Minutes
Case Study 2: Nanoelectrical Characterization
Vous devez accepter les cookies pour lire cette video.
Paramètres des cookies
Presented by Khaled Kaja, Ph.D., Applications Scientist, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Kelvin Probe Force Microscopy: a suite of implementations
[00:01:56]
FM-KPFM on hBN: high spatial resolution and sensitivity
[00:03:28]
PF FM-KPFM on hBN: Probing the capacitance variations
[00:06:47]
Piezo Force Microscopy (PFM): single crystal lead PMN-PT
[00:08:18]
DataCube Contact Resonance PFM: follow the peak
[00:12:40]
PeakForce Magnetic Force Microscopy (PF MFM)
[00:15:48]
Tip scanning advantage: external implementations for advanced instrumentation measurements
Watch Now | 20 Minutes
Live Demonstration: Dimension Nexus
Vous devez accepter les cookies pour lire cette video.
Paramètres des cookies
Presented by Bede Pinttenger, Ph.D, Sr. Staff Development Scientist, AFM Applications, Bruker
PRESENTATION HIGHLIGHTS:
[00:00:00]
Quick overview of the Nexus
[00:01:15]
ScanAsyst Plus software overview
[00:02:54]
Tapping mode demo
[00:05:08]
PeakForce Tapping/ScanAsyst Plus demo
[00:08:05]
Automation on dimension microscopes
[00:17:09]
Scan results
[00:19:02]
Q&A
Watch Now | 8 Minutes
Question and Answer
Vous devez accepter les cookies pour lire cette video.
Paramètres des cookies
PRESENTATION HIGHLIGHTS:
[00:00:00]
What is the main difference between the Icon and the Nexus?
[00:01:00]
What kind of application modules can be used with Nexus?
[00:02:21]
What kind of FastScan capabilities does the nexus have?
[00:03:21]
What is the sampling frequency on the nano scope six controller?
[00:04:20]
Is there a heating stage available, like for PIO electrics?
[00:05:00]
Is it possible to change the ICON Scanner Head into the Dimension Nexus system?
[00:06:10]
Conclusion
Featured Products and Technology
Dimension Nexus AFM
Redefining the quintessential value AFM with highest performance in its class
En savoir plus
DOWNLOAD BROCHURE
NanoScope 6 Controller
Leading-edge AFM controller built on an innovative high-speed, low-noise architecture for delivering unprecedented measurement performance
En savoir plus
DOWNLOAD BROCHURE
AFMs for Materials
Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
En savoir plus
REQUEST MORE INFORMATION
RETURN TO SESSION OVERVIEW