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▶ Watch On-Demand | 45 Minutes

On-Demand Access: Thin Film Characterization Using Spectroscopic Reflectometry and Ellipsometry Techniques

Learn more about the latest and most advanced spectroscopic reflectometry and ellipsometry techniques.

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Presented by: Chris Claypool, Sr. Director, R&D, FilmTek Products (November 17, 2022)
Watch Now | 6 Minutes

Part 1: Introduction to Ellipsometry and Reflectometry Techniques

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Presented by: Chris Claypool, Sr. Director, R&D, FilmTek Products (November 17, 2022)
Watch Now | 15 Minutes

Part 2: Technologies That Make Filmtek Great

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Presented by: Chris Claypool, Sr. Director, R&D, FilmTek Products (November 17, 2022)
Watch Now | 10 Minutes

Applications and Case Studies

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Presented by: Chris Claypool, Sr. Director, R&D, FilmTek Products (November 17, 2022)

Featured Product and Technologies

OVERVIEW-filmtek

Spectroscopic Ellipsometry

Highly sensitive, repeatable measurement of single-layer thin films and small multilayer structures, capable of characterizing thickness and optical properties even on layers less than a single atomic layer thick
詳細はこちら
OVERVIEW-filmtek

Spectroscopic Reflectometry

Expedited film thickness and optical constant measurements well suited for in-situ production quality assessment, particularly on thick films in development and production environments and semiconductor wafers
詳細はこちら
OVERVIEW-filmtek

Ellipsometry and Reflectometry Systems

High-accuracy film measurement well beyond the thickness range and refractive index resolution of traditional ellipsometers/reflectometers
詳細はこちら