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▶ Watch On-Demand | 3 Sessions | 2 Hours
Nanoscale Characterization of Glass and Ceramic Surfaces
Learn about Bruker tools and techniques for the nanoscale characterization of glass and ceramic surfaces
Watch Individual Sessions:
Nanoscale Investigation of Glass and Ceramic Materials using AFM
Nanoscale Investigation of Glass and Ceramic Materials using Optical Profilers
Nanoscale Investigation of Glass and Ceramic Materials using Nanoindentation
Presented by Vishal Panchal, Ph.D., Application Scientist, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Introduction & Background
[00:01:47]
Working with Glass
[00:07:21]
Sapphire Inspection & PSS Metrology
[00:11:54
] Stressed Materials
[00:13:09]
Liquid Crystal Polymers
[00:14:17]
Coated Glass
[00:17:00
] AFM Live Demonstration
[00:28:20]
Q&A
Learn More: AFMs for Materials
Presented by Udo Volz, Ph.D., Application Scientist, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Product Overview & Interferometer Setup
[00:05:53]
Optical Profiler Live Demonstration
[00:26:57]
Textured Glass Sample
[00:27:54
] Summary
[00:29:16]
Q&A
Learn More: 3D Optical Profilers
Presented by Ude Hangen, Ph.D., Application Manager, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Introduction & Background
[00:05:52]
Float Glass Investigation
[00:08:39]
Compressive Stress in Ion-Exchange Glasses
[00:18:29
] Fracture Toughness Calculation From Radial Cracks
[00:24:31]
Dynamic Nanoindentation
[00:33:35]
Q&A
Learn More: Nanoindenters
Featured Products and Technology
AFMs for Materials
Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
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Nanomechanical Test Systems
Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales
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3D Optical Profilers
Non-contact 3D surface measurement, inspection, and analysis
詳細はこちら
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