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▶ Watch On-Demand | 3 Sessions | 2 Hours
Nanoscale Characterization of Glass and Ceramic Surfaces
Learn about Bruker tools and techniques for the nanoscale characterization of glass and ceramic surfaces
Watch Individual Sessions:
Nanoscale Investigation of Glass and Ceramic Materials using AFM
Nanoscale Investigation of Glass and Ceramic Materials using Optical Profilers
Nanoscale Investigation of Glass and Ceramic Materials using Nanoindentation
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Presented by Vishal Panchal, Ph.D., Application Scientist, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Introduction & Background
[00:01:47]
Working with Glass
[00:07:21]
Sapphire Inspection & PSS Metrology
[00:11:54
] Stressed Materials
[00:13:09]
Liquid Crystal Polymers
[00:14:17]
Coated Glass
[00:17:00
] AFM Live Demonstration
[00:28:20]
Q&A
Learn More: AFMs for Materials
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Presented by Udo Volz, Ph.D., Application Scientist, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Product Overview & Interferometer Setup
[00:05:53]
Optical Profiler Live Demonstration
[00:26:57]
Textured Glass Sample
[00:27:54
] Summary
[00:29:16]
Q&A
Learn More: 3D Optical Profilers
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Presented by Ude Hangen, Ph.D., Application Manager, Bruker (June 1, 2022)
PRESENTATION HIGHLIGHTS:
[00:00:00]
Introduction & Background
[00:05:52]
Float Glass Investigation
[00:08:39]
Compressive Stress in Ion-Exchange Glasses
[00:18:29
] Fracture Toughness Calculation From Radial Cracks
[00:24:31]
Dynamic Nanoindentation
[00:33:35]
Q&A
Learn More: Nanoindenters
Featured Products and Technology
AFMs for Materials
Bruker's materials research atomic force microscopes, powered exclusively by PeakForce Tapping® technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.
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Nanomechanical Test Systems
Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales
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3D Optical Profilers
Non-contact 3D surface measurement, inspection, and analysis
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