NanoScope 6 Controller
NanoScope 6 Controller: Leading-Edge Technology with a Legacy of Innovation
Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope® 6 AFM controller provides unprecedented capabilities and customization for nanoelectrical and nanomechanical property measurements with Bruker AFMs. Its open-architecture design allows users to quickly customize and optimize scanning parameters to meet even the most demanding application requirements. This latest generation controller enables proprietary AFM modes that competing systems cannot properly perform. Ultimately, NanoScope 6 delivers ultimate ease of use without compromising function or flexibility to support high-impact research and innovation for both academia and industry.
Only NanoScope 6:
- Enables the next generation of PeakForce Tapping and more unique modes than any other platform, including AFM-nDMA, SECM, SS-PFM, and DataCubes for quantitative data in every application
- Utilizes an expandable open architecture for custom experiments and future developments with full signal access, real-time scripting, and Python data integration
- Provides ultimate ease of use with Bruker’s exclusive ScanAsyst®, including complete self-optimization and elimination of cantilever tuning
- Delivers automation capability for QA/QC applications, with all advanced modes and full report generation
Unmatched Access to Our Expansive AFM Imaging Mode Library
NanoScope 6 enables all of the most popular AFM imaging modes while also enabling more unique Bruker modes than even other NanoScope controllers. These include:
- PeakForce SECM;
- PeakForce QNM High Accuracy;
- Fast Force Volume (standard and Contact Resonance);
- Icon Fast-Tapping;
- AFM-nDMA; and
- DataCube modes.
This controller also supports the next level of performance and capability for Bruker's proprietary PeakForce Tapping technology and enables exclusive access to Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM) — the newest, most advanced nanoelectrical imaging mode available.
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Optimal Performance for Challenging Experiments
The NanoScope 6 features multiple high-speed 16-bit ADCs at 50 MHz and 10 MHz combined with user-controllable digital filtering, digital signal normalization, and eight 20-bit ADCs at 500 kHz. High-speed data acquisition of the fastest events runs in parallel to the high-speed, low-noise feedback and acquisition of eight image channels at highest resolution and repeatability. Scan control occurs at 32-bit resolution with 2 MHz update rate for lowest noise even at high scan rates and without need for limit adjustments.
These combined features enable NanoScope 6 to achieve uniquely high sensitivity and accuracy for low- and small-signal collection and quantitative measurements as well as best-in-class control of noise, crosstalk, and background.
Its innovative design and architecture also optimize the NanoScope 6 for nanoelectrocal measurement sequences, delivering enhanced STM, CAFM/TUNA, and PFM performance.
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Unparalleled Ease of Use in the Broadest Range of Applications
NanoScope 6 is compatible with reliable, commercially-available probes, offers the ability to fully automate measurement and analysis, and promises easier signal interpretation in the absence of obstructive noise and background. Combined with exclusive ScanAsyst, AutoMET, and RampScript software integrations, NanoScope 6 offers even users with little-to-no AFM experience the ability to probe complex samples and collect high-quality data.
This makes the NanoScope 6 the easies-to-use and most accuracte and efficient AFM controller available for even complex experiments. It also demonstrates the greatest possible versatility for use across the materials sciences, semiconductor, and electronics industries and in measurement application areas ranging from polymers and battery research to the development of advanced thin films, coatings, and ICs.
