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Nanoscale Infrared Spectroscopy

High-Performance Photothermal AFM-IR for Novel Nanoscale Chemical Analysis

Learn about the capabilities of the photothermal AFM-IR technique using Bruker’s Dimension IconIR platform. 

Photothermal AFM-IR enables chemical identification on the nanoscale

In this webinar, we illustrate the capabilities of the photothermal AFM-IR technique using Bruker’s Dimension IconIR platform. Highlights include:

  • Overview of key factors governing photothermal AFM-IR
  • Examples that achieve high sensitivity of <1 nm, high lateral resolution of <2 nm, and high scan rates for IR imaging
  • Methods for overcoming mechanically induced artifacts
  • Q&A session 
Watch On Demand Webinar Summary

Webinar Summary

Atomic Force Microscopy (AFM) is a multiparametric imaging technique that characterizes the nanomechanical properties of advanced materials. Nanoscale IR spectroscopy identifies and quantifies the chemical composition and structure of materials. Combining these techniques in photothermal AFM-IR spectroscopy enables the multimodal analysis and correlation of nanoscale mechanical, electrical, and chemical properties.

The photothermal AFM-IR technique was first developed by Alexandre Dazzi in 2005 and the first commercial nanoIR system became available in 2010. Since then, significant advances have been made in the IR laser sources, system designs, and operating modes that have led to improved detection sensitivity, lateral resolution, measurement speeds, and correction for mechanical artifacts.

The IconIR platform encompasses these cutting-edge advances to deliver industry-best capabilities, outstanding performance, and AFM-IR measurements that continue to deliver novel, previously inaccessible insights into material properties.

In this webinar, we illustrate the capabilities of the photothermal AFM-IR technique using Bruker’s Dimension IconIR platform.

Highlights include:

  • Overview of key factors governing photothermal AFM-IR
  • Examples that achieve high sensitivity of <1 nm, high lateral resolution of <2 nm, and high scan rates for IR imaging
  • Methods for overcoming mechanically induced artifacts
  • Q&A session

Find out more about the technology featured in this webinar or our other solutions for photothermal AFM-IR:

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Speaker

Dr. Qichi Hu, Senior Applications Scientist

Qichi is currently a Senior Staff Applications Scientist at Bruker Nano. He received a bachelor’s degree from Peking University and Ph.D. from University of British Columbia. He then did postdocs in U.S. university and national labs. Qichi has been working on nanoIR development and applications for over a decade, at Anasys and now at Bruker.

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