Advantages of Standard-Supported micro-XRF Quantification
Where are we today in terms of performance of fundamental parameter quantification?
Standard or certified reference samples are the main support for the vast majority of quantitative analytical techniques. Reference samples are used to validate analytical methods as well as to determine the composition of unknown samples. Developments in fundamental parameter (FP) quantification algorithms make them a valid alternative.
FP quantification algorithms rest on the fact, that for micro-XRF almost the complete process from X-ray generation to data acquisition, including of course the interaction of X-rays with the sample, can be described using physical models and tabulated fundamental parameters. The current models allow the quantificaton of a sample without reference samples and with a high accuracy (<< 5 % relative error).
The remaining uncertainties can be attributed, mainly, to knowledge of the fundamental parameters themselves, and the description of the instrument properties (i.e. mostly the geometry). Interestingly, both issues can be overcome by combining the FP-quantification with well-defined reference samples. This combination of the best of two worlds, the flexibility of FP-based quantification with the reliability of a standard-based quantification, shows a path towards the future of high-precision quantitative material analysis.
The quality of standardless quantification today rivals that of standard-based quantification and the method is much more flexible. Specifically, any sample can be analysed without the need of an initial calibration and with a quality that matches that of traditional standard-based quantification.
In this webinar we will explore how fundamental parameter quantification can be used to carry out micro-XRF mapping and measurements with a high accuracy. We will explore how state-of-the-art FP quantification can be used to carry out standardless micro-XRF analysis that rivals standard-based measurements.
If you would like learn more about state-of-the-art FP quantification join us for this last webinar of the back to the roots series.
If you found this webinar insightful we encourage you to watch our other “Back to the Roots” micro-XRF Webinars:
- Watch on Demand: Back to the Roots Part I - Introducing micro-XRF as an Analytical Technique
- Watch on Demand: Back to the Roots Part II - Using micro-XRF for Qualitative Analysis
- Watch on Demand: Back to the Roots Part III - Using micro-XRF for Quantitative Analysis
- Watch on Demand: Back to the Roots Part IV - An Introduction to micro-XRF on SEM
Speakers
Dr. Roald Tagle
Global Manager Application Science, Bruker Nano Analytics
Falk Reinhardt
Senior Application Scientist micro-XRF, Bruker Nano Analytics
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