An Overview of Surface Roughness Measurements: Choice of Technique and Analysis
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Presented by Ashar Abu Zubaida, Ph.D. Jawaharlal Nehru Center for Advanced Scientific Research (April 20, 2020)
PRESENTATION HIGHLIGHTS:
[00:03:44] The importance of surface texture
[00:07:59] Techniques to measure surface texture
[00:23:11] How to choose the correct surface measurement instrument
[00:25:06] Highlighting and comparing Bruker's Dektak and Optical profilers
[00:25:06] Roughness norms and standards
[00:41:25] Areal roughness and 2D/3D roughness parameters
Measuring Profile and Real Mean Roughness with 3D WLI-Based Optical Profilers
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Presented by Samuel Lesko, Ph.D. Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology and Ian Armstrong, Ph.D. North America Application Manager, Bruker (April 06, 2020)
PRESENTATION HIGHLIGHTS:
[00:04:44] What is roughness?
[00:08:59] Profile roughness filters, data processing, measurement setup
[00:18:19] How different is areal roughness?
[00:24:59] How to choose between profile vs areal roughness measurements
[00:28:19] Best practices for roughness measurement
[00:44:11] Demonstration of measurement (user interface) on Bruker ContourGT-X system
[00:48:35] Conclusion and Q&A
Technical Demonstration
NPFLEX floor-standing white light interferometer
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KEY POINTS:
[00:00:01] Instrument components and measurement setup
[00:02:06] Close up of sample stage and explanation of objective selection
[00:03:43] Measurement 1: Bottom/center of the sample
