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3D Optical Profilers

Knowledge Pack: 3D Surface Measurement

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Application Notes

Comparing 3D Optical Microscopy Techniques for Metrology Applications
Advantages of Measuring Surface Roughness with White Light Interferometry
Characterizing Surface Quality: Why Average Roughness (Ra) Is Not Enough

Webinar Recordings

An Overview of Surface Roughness Measurements: Choice of Technique and Analysis

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Presented by Ashar Abu Zubaida, Ph.D. Jawaharlal Nehru Center for Advanced Scientific Research (April 20, 2020)

       PRESENTATION HIGHLIGHTS:

  • [00:03:44] The importance of surface texture
  • [00:07:59] Techniques to measure surface texture
  • [00:23:11] How to choose the correct surface measurement instrument
  • [00:25:06] Highlighting and comparing Bruker's Dektak and Optical profilers
  • [00:25:06] Roughness norms and standards
  • [00:41:25] Areal roughness and 2D/3D roughness parameters
Measuring Profile and Real Mean Roughness with 3D WLI-Based Optical Profilers

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Presented by Samuel Lesko, Ph.D. Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology and Ian Armstrong, Ph.D. North America Application Manager, Bruker (April 06, 2020)

       PRESENTATION HIGHLIGHTS:

  • [00:04:44] What is roughness?
  • [00:08:59] Profile roughness filters, data processing, measurement setup
  • [00:18:19] How different is areal roughness? 
  • [00:24:59] How to choose between profile vs areal roughness measurements 
  • [00:28:19] Best practices for roughness measurement 
  • [00:44:11] Demonstration of measurement (user interface) on Bruker ContourGT-X system
  • [00:48:35] Conclusion and Q&A

Technical Demonstration

NPFLEX floor-standing white light interferometer

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       KEY POINTS:

  • [00:00:01] Instrument components and measurement setup
  • [00:02:06] Close up of sample stage and explanation of objective selection
  • [00:03:43] Measurement 1: Bottom/center of the sample
  • [00:07:33] Measurement 2: Tilted sample
  • [00:09:20] Example: Wear volume measurement

 
We hope you enjoyed learning more about using WLI-based optical profilometry for 3D surface measurement. To continue the conversation:

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