2D Materials and Nanophotonics
Unique capabilities to characterize the nanoscale optical, chemical, and material properties of novel 2D and quantum materials
2D materials and nanophotonics provide an exciting area of materials research and development for a wide range of new applications. The nanoIR3-s scattering SNOM (s-SNOM) platform provides unique capabilities to characterize the nanoscale optical, chemical, and material properties of a broad range of novel 2D and quantum materials. Applications include:
- Plasmonics and surface polaritons
- 2D materials including graphene
- Nanophotonics
- Optical antennas
- Nanoscale optical properties
hBN Phonon-Polaritons
Nano imaging of surface phonon polaritons (SPhP) on hexagonal boron nitride (hBN): (a) AFM height image showing homogeneous hBN surface with different layers on Si substrate; (b) s-SNOM amplitude showing strong interference fringes due to propagating SPhP along the surface on hBN; (c) s-SNOM phase showing a difference phase with alternating layer thicknesses. Images (b) and (c) show the changing wavelengths of the SPhP across the layers.
Graphene Plasmonics
s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. 3D view phase image (left), s-SNOM phase image (center) with a line cross-section of the SPP standing wave, and s-SNOM amplitude image (right).
2D Metamaterials
Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045
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Nanoantennas
nanoIR3-s provides s-SNOM amplitude (bottom) and s-SNOM phase (top) data. Data acquired using nanoIR3-s using s-SNOM mode with POINTspectra CW QCL laser source.
Nano FTIR Spectroscopy
Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US.
Nano FTIR Spectroscopy
AFM-IR spectra and images of a solution-processed CH₃NH₃PbI₃ photodetector collected as deposited (c,d) and after annealing at 140° C (e,f). Height images (top row) and corresponding AFM-IR images (bottom row). Images courtesy of Dong, R., Fang, et al, (2015), Adv. Mater., 27: 1912–1918.
s-SNOM Imaging of Multilayer Nylon and PE Sample
s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm⁻¹ were observed for nylon. Subsequent s-SNOM imaging at 1640 cm⁻¹ showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM.
