On-Demand Session: Nanoelectrical Characterization Using Atomic Force Microscopy
See how to best leverage AFM to characterize a variety of electrical properties on the nanoscale.
Nanoelectrical Characterization Using AFM
PRESENTATION HIGHLIGHTS:
- [00:00:00] Introduction to nanoelectrical characterization using AFM
Measuring nanoelectrical properties:
- [00:08:02] Conductivity
- [00:17:10] Charges, electric fields, surface potential, and work function
- [00:32:52] Carriers
- [00:42:53] Dielectric properties
- [00:50:16] Piezo and ferroelectric properties
- [00:59:42] Summary
Question and Answer Session
PRESENTATION HIGHLIGHTS:
- [00:00:00] Do most of the methods presented today require a special type of probe?
- [00:01:55] Are conductive diamond cantilevers worth the investment vs. typical platinum-coated probes?
- [00:03:21] What are your preferred probes for AFM KPFM and EFM?
- [00:04:48] What does the DC capacitance signal represent in SCM mode?
- [00:07:38] Does conductive AFM require any extra sample preparation?
- [00:09:10] Without the dedicated KPFM module, what KPFM modes can be run on their [Bruker] AFM system?
- [00:10:23] Is reverse-tip scanning applicable for thin films on a substrate like silicon? Is it possible to use such a small sample? If so, how would you recommend mounting it?
