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Presented by Khaled Kaja, Ph.D., Bruker Applications Scientist, and Peter De Wolf, Ph.D., Bruker Director of Technology & Application Development (September 12, 2024)
PRESENTATION HIGHLIGHTS:
[00:00:00] Introduction to nanoelectrical characterization using AFM
Measuring nanoelectrical properties:
[00:08:02] Conductivity
[00:17:10] Charges, electric fields, surface potential, and work function
[00:32:52] Carriers
[00:42:53] Dielectric properties
[00:50:16] Piezo and ferroelectric properties
[00:59:42] Summary
Watch Now | 15 Minutes
Question and Answer Session
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Presented by Khaled Kaja, Ph.D., Bruker Applications Scientist, and Peter De Wolf, Ph.D., Bruker Director of Technology & Application Development (September 12, 2024)
PRESENTATION HIGHLIGHTS:
[00:00:00] Do most of the methods presented today require a special type of probe?
[00:01:55] Are conductive diamond cantilevers worth the investment vs. typical platinum-coated probes?
[00:03:21] What are your preferred probes for AFM KPFM and EFM?
[00:04:48] What does the DC capacitance signal represent in SCM mode?
[00:07:38] Does conductive AFM require any extra sample preparation?
[00:09:10] Without the dedicated KPFM module, what KPFM modes can be run on their [Bruker] AFM system?
[00:10:23] Is reverse-tip scanning applicable for thin films on a substrate like silicon? Is it possible to use such a small sample? If so, how would you recommend mounting it?