Characterization of Nanomaterials and Nanostructures in the SEM using On-Axis TKD
Nanomaterial and Nanostructure Analysis using t-EBSD
Join us for an exciting webinar presented by our invited speaker, Dr. Alice Bastos da Silva Fanta, Senior Researcher at the National Centre for Nano Fabrication and Characterization at DTU, Denmark and Dr. Daniel Goran, Sr. Product Manager EBSD at Bruker Nano Analytics.
The scanning electron microscope (SEM) is an essential tool for characterizing nanomaterials and nanostructures. However, conventional SEM techniques can be limited in their ability to provide quantitative and qualitative data on the crystallographic orientation of materials at the nanoscale.
In this webinar, we will introduce On-Axis Transmission Kikuchi Diffraction (TKD), also known as t-EBSD, which enables crystallographic orientation mapping with high spatial resolution in the SEM. We will discuss the principles and advantages of this technique and showcase its applications with a focus on in-situ heating experiments of thin films.
Attendees will have the opportunity to learn about the latest advancements in On-Axis TKD and gain insights into how this technique can be used to reveal the structural and functional properties of materials at the nanoscale.
Don't miss this chance to expand your knowledge of advanced SEM techniques and their application in materials science. Register now to secure your spot in the webinar.
Who Should Attend?
- All-level users interested in characterization of nanostructured material
- Researchers and specialists interested in Dark Field & Bright Field imaging as well as orientation mapping at the nanoscale
- FIB/SEM microscopists interested in advanced analytical techniques
Speakers
Dr. Alice Bastos da Silva Fanta
Senior Researcher at the National Centre for Nano Fabrication and Characterization at DTU, Denmark
Dr. Daniel Goran
Product Manager EBSD, Bruker Nano Analytics
Watch this Webinar On-Demand
Please enter your details below to gain on-demand access to this webinar.