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Large-Sample Dimension IconIR: Defect detection and Chemical-ID Characterization of Semiconductor Devices

Our experts demonstrate the capabilities of the IconIR for semiconductor materials research

Presented by Miriam Ungler, Ph.D., Applications Manager EMEA, NanoIR, Bruker Nano GmbH and Hartmut Stadler, Ph.D., Applications Engineer, Bruker Nano GmbH (February 23, 2022)

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[00:00:00] Welcome
[00:02:27] An Introduction to the Dimension IconIR
[00:11:37] Applications in the Semiconductor Industry
[00:31:55] Demonstration of the Dimension IconIR
[00:45:18] Q/A & Summary

Large-Sample Dimension IconIR: Defect detection and Chemical-ID Characterization of Semiconductor Devices

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