AFM Modes

Contact Mode

The original AFM mode, providing topographic imaging and a gateway to advanced techniques

Contact mode is the basis for all AFM techniques in which the probe tip is in constant physical contact with the sample surface. While the tip scans along the surface, the sample topography induces a vertical deflection of the cantilever. A feedback loop maintains this deflection at a preset load force and uses the feedback response to generate a topographic image.

Contact mode is suitable for materials science, biological applications and basic research. It also serves as a basis for further SPM techniques that require direct tip-sample contact. And now, new ScanAsyst® Plus self-optimizing imaging software comes standard with select NanoScope® 6 systems, bringing expanded capability and ease of use to Contact Mode measurements.

Request More Information Learn More: The Definitive AFM Modes Handbook

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Native Collagen fibrils exhibiting typical 67nm banding pattern.

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Get instant access to the full-length AFM modes handbook.

The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

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