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Atomic Force Microscope

MultiMode 8-HR

World's most extendable high-resolution AFM
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MultiMode 8-HR

The MultiMode® platform's long history of success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The MultiMode 8-HR atomic force microscope (AFM)  further advances these capabilities to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FASTForce Volume, and exclusive Bruker probes technology.

Highest
resolution imaging
Enables researchers to routinely create the most detailed images on molecular and biological structures, such as protein or DNA double helix.
Easy
expert-quality results
Allows users of all experience levels to achieve faster, more consistent highest quality results.
Unlimited
open-access flexibility
Supports a wide range of accessories to tailor your AFM to your specific application.
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Features

NanoScope Open-Access Toolbox

MultiMode 8-HR offers a variety of options to monitor signals, modify real-time operation, and implement custom offline analysis. Standard NanoScope® tools exist for direct MATLAB import of data and ASCII export.You can monitor internal signals and customize signal inputs with Virtual SAM, or expand your capabilities with optional SAM lll. Control of AFM functions are available through optional nanolithography and NanoScope COM interface. Ultimately, you can leverage NanoScope Open-Access capabilities to extend your experiments beyond standard AFM modes to develop your own modes for obtaining new unique datasets.

SAM6 signal access module

PeakForce-HR Module

Polymer brush structures imaged using PeakForce-HR. Scan size 1 μm at 5 Hz. Sample courtesy of S. Sheiko, University of North Carolina, Chapel Hill.

The MultiMode 8-HR has been designed to take the fullest advantage of PeakForce Tapping technology, providing 6X faster PeakForce Tapping imaging in air compared to most conventional AFMs, with no loss of performance.

Learn more about PeakForce Tapping

Advanced Environmental Control

MultiMode 8-HR is available with both sample heating and cooling capabilities. The low-range option enables heating and cooling between -35°C and 100°C in either air or fluids. The high-range option heats up to 250°C and is often used to study polymer phase transitions. It is unique in that it allows both gas purging to prevent sample oxidation and tip heating to prevent tip contamination. Environmental control accessories are available both integrated with the heater/cooler options or as separate environmental chambers.

Download Environmental Control Datasheet
Poloxamer tri-block copolymer (BASF Pluronic) sample imaged with PeakForce-HR. Starting at room temperature (left), the sample melts upon heating to 60°C (middle), and then recrystallizes upon cooling to 55°C (right). Scan sizes 3 μm, imaged at 10 Hz.

Powered by the NanoScope 6 AFM Controller


Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.

NanoScope 6 uniquely enables Bruker AFMs to:

  • Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
  • Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
  • Optimize and customize scanning parameters to meet even the most demanding research and industry measurement requirements.

Contact us to discuss your measurement requirements, the systems best-suited to your applications, and options for system specialization, or submit a sample run request to validate that a Bruker AFM will meet your specific needs.

Bruker AFM Sample Run Request
AFM Modes

Expand Your Applications with AFM Modes

With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

Learn More About AFM Modes

MultiMode 8-HR Data Gallery

PeakForce TUNA current map of poly(3-hexylthiophene) (P3HT) organic conductive nanowires using 3V bias. Image shows a 3 μm scan area where the current varies from 0 to 80 pA.
Vanadium pentoxide thin film imaged using TappingMode at a scan size of 5 μm. The film was used as the positive electrode in a lithium micro-battery and examined in its original, pristine condition (left), after the first discharge (middle), and after the subsequent charge (right). Even this single charge/discharge cycle irreversibly changes the film structure. Images courtesy of B. Fleutot, H. Martinez, B. Pecquenard, J.B. Ledeuil, A. Levasseur, and D. Gonbeau, University of PAU, France.
Syndiotactic polypropylene (sPP) and polyethylene oxide (PEO) blend imaged with PeakForce-HR (3 µm at 5 Hz).
PeakForce QNM images revealing a molecular defect on a polydiacetylene crystal, in air. Individual molecules are resolved in height (A) as well as adhesion (B) and stiffness (C) maps, with a notable decrease in stiffness at the defect site. Image size 10 nm.
This modulus image shows the subtle transition between the ULDPE tie layer to the PS/LDPE sealant layer of cross sectioned packaging material. Mapping the modulus at high spatial resolution reveals lamella from the tie layer act as nucleation sites penetrating into the sealant and increasing lamellar ordering within 1 μm from the interface. Image size 3 μm.
Height (A) and current (B) maps of a carpet of vertical carbon nanotubes, obtained with PeakForce TUNA, which are impossible to image with contact mode. Image size 1 μm.
Atomic resolution height and adhesion of mica substrate on MM8 (15 nm scan) imaged with PeakForce Tapping.
Modulus map of polydiethylsiloxane (PDES) imaged using PeakForce QNM. Image shows a 3 μm scan area where the modulus varies from 1.5 to 15 MPa.
Accessories

Enhance Your Bruker AFM

Bruker AFM Probes

Bruker AFM Probes

Find a wide variety of AFM probes, cantilevers and accessories in our online store. Our AFM expertise is built into every probe!
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Webinars

Recent AFM Webinars

Testimonials

Hear What Our Customers Have to Say

With the help of Conductive Atomic Force Microscopy (C-AFM) analysis in the PeakForce Tunneling AFM (PeakForce TUNA) module of the MultiMode 8, we were able to understand the location-specific nanoscale electrical conductivity of doped semiconductors. This has led us to explore many new materials and their electronic properties at nanoscale. We have been using the MultiMode 8 for the past three years and I must say this instrument is really powerful and robust.

Dr. Emila Panda, Indian Institute of Technology (IIT) Gandhinagar, India

For us, the MultiMode 8 is truly a workhorse. We are very productive with it, publishing up to 20 papers per year. We find it invaluable for its closed small-volume liquid cell capabilities.

Dr. Jim De Yoreo, Pacific Northwest National Laboratory

With the combined application of PeakForce QNM and PeakForce TUNA we were uniquely able to determine the nanostructure and ionic conductivity distribution on humidity sensitive ionomers with unprecedented quality and resolution. For us, the versatility and flexibility of the MultiMode 8 AFM with these modes opens the path for numerous explorations of materials for electrochemical energy applications.

Dr. Renate Hiesgen, University of Applied Sciences Esslingen, Germany

I recently upgraded my NanoScope III MultiMode AFM to the new MultiMode 8, and I really love the new ScanAsyst mode for collecting AFM images. It is so simple, and it makes training new students a breeze. If I align the laser on the tip, the student can begin collecting his/her own images in less than 30 minutes. This is so much easier than tapping mode, and the images are just as good. I was quite impressed.

Dr. Maryanne Collinson, Virginia Commonwealth University

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