M6 JETSTREAM

2x60

mm²

SDD size

Dual silicon drift detector option for fastest acquisition

80x60

cm²

Scannable surface

Mapping larger samples in one run

100-500

µm

Adjustable spot size

The spot size can be adjusted in five steps to match the structure of the sample

State of the Art in Large Area micro-XRF

Micro-XRF on large samples (also called macro-XRF or MA-XRF) has become a decisive method for the analysis of paintings, geological samples, archeological artifacts and industrial components. The M6 JETSTREAM drives these analyses to the highest speed and accuracy. With its mobile wheelbase and adjustable frame, the M6 JETSTREAM can be used on-site instead of transporting the sample to the lab.

Measurement of upright samples or horizontal surfaces
Scannable area up to 800 x 600 mm²
"On the fly" analysis for highest mapping speed
Adjustable spot size to match the structure of the sample
XFlash® SDD technology with up to 2 x 60 mm² detector area
Optional aperture management system (AMS) to gain depth of focus on uneven surfaces

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What Can You Expect from the M6 JETSTREAM?

Micro-XRF Study of the Troodontid Dinosaur Jianianhualong Tengi Reveals New Biological and Taphonomical Signals, Jinhua Li et. al, Atomic Spectroscopy 2021 42(1)

Get spatially resolved information about the elemental distribution of almost any surface
Record data over large areas in one run
Combine high-resolution optical images with a full spectrum per pixel in one HyperMap dataset
Process data and extract object spectra , line scans and chemical phases from maps
Quantify spectra using standardless Fundamental Parameter (FP) methods
Reduce cost and time by avoiding logistics and ensuring security of valuable objects

Discover the broad range of mico-XRF samples

Applications of the M6 JETSTREAM in Cultural Heritage

The elemental mapping of 3D cultural heritage objects or those with a high surface topography is possible using the right system. Here we demonstrate how the M6 JETSTREAM, with its patented Aperture Management System (AMS), can vizualize the elements in areas that are as far as 10 cm away from the spectrometer.

Technical details

Up to 100 mm/s stage speed	Mapping can be conducted "on the fly" with dwell times down to 1 ms per pixel
30mm² or 60mm² SDDs with ≤145 eV	The M6 JETSTREAM can be equipped with different Bruker XFlash® detectors, all specified with ≤145 eV at Mn Kα
±10° tilt in vertical measurement mode	In addition to the 90° tilt between horizontal and vertical measurement, the rig can be tilted in fine steps to adjust to inclined surfaces