EN
My Bruker
Contact Expert
Products & Solutions
Applications
Services & Support
News & Events
About
Careers
Please use at least 2 characters (you are currently using 1 character)
Languages
Deutsch
English
Español
Français
Italiano
Polski
Português
Русский
中文
日本語
한국어
▶ Watch On-Demand | 50 Minutes
On-Demand Session: Thermomechanical Integrity of Thin Films and Nano-Interconnects
Learn about nanoindentation-based methods to improve thermomechanical design of integrated structures
You need to accept cookies to play this video.
Cookies Settings
Presented by Kris Vanstreels, Ph.D., Researcher, IMEC (March 6, 2024)
PRESENTATION HIGHLIGHTS:
[00:00:00]
About IMEC
[00:08:19]
Introduction and Motivation
[00:11:20]
Experimental Strategy for Thermo-mechanical Integrity of Thin Films and Nano-interconnects
[00:18:17]
Indentation-Based Fracture and Adhesion of Thin Films
[00:34:06]
Benchmarking Chip Package Interaction Integrity
[00:43:26]
Conclusions
Q&A
You need to accept cookies to play this video.
Cookies Settings
PRESENTATION HIGHLIGHTS:
[00:00:24]
For the wedge indentation testing, is the lamination area measurement a topographical base measurement?
[00:01:50]
How do you calibrate your force at elevated temperatures in the indentation experiment?
[00:03:23]
Regarding the OSG material, is that a polymer or glass?
[00:04:38]
What efforts are required for four-point bending compared to indentation testing?
Featured Products and Technology
Nanomechanical Metrology Tools
Automated metrology solutions deliver high-speed, high-resolution, highest-sensitivity mechanical property and/or interfacial adhesion measurements
Read More
REQUEST MORE INFORMATION
Nanomechanical Instruments for SEM/TEM
Hysitron PicoIndenters for in-situ mechanical experiments in scanning electron and transmission electron microscopes
Read More
REQUEST MORE INFORMATION
Nanomechanical Test Systems
Stand-alone solutions for highly accurate and reliable quantitative mechanical and tribological characterization at the nano- and microscales
Read More
REQUEST MORE INFORMATION
RETURN TO SESSION OVERVIEW