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▶ Watch On-Demand | 57 Minutes

On-Demand Session: The Fundamentals of AFM Probe Selection

Learn how to select the right probe for your application 

Watch Individual Sessions:

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Introduction; presented January 19, 2023
Watch Now | 17 Minutes

How to Select a Probe

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Presented by John Thorton, Senior Application Scientist, Bruker (January 19, 2023)

       PRESENTATION HIGHLIGHTS:

  • [00:00:11] Overview of probe characteristics and considerations for selection
  • [00:05:27] Probe selection based on AFM mode
  • [00:06:25] Probe selection based on scan rate/imaging speed requirements
  • [00:08:52] How to choose a probe coating
  • [00:10:50] How to choose the right probe tip shape and radius
  • [00:13:50] How to get probe recommendations using Bruker AFM software
  • [00:15:27] Q&A
Watch Now | 22 Minutes

Recommended Probes for Material Science Applications

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Presented by John Thorton, Senior Application Scientist, Bruker (January 19, 2023)

       SEE RECOMMENDED PROBES FOR:

  •  [00:00:15] Topography measurements
  • [00:05:29] High resolution imaging
  • [00:06:22] Measuring high aspect ratio structures (trenches and lines, TSVs)
  • [00:07:48] Automated AFM critical metrology
  • [00:08:49] High-speed imaging
  • [00:10:49] Mechanical measurements
  • [00:14:25] Nanoelectrical measurements
  • [00:18:50] Magnetic characterization
  • [00:19:51] Q&A
Learn More: AFM for Materials

Featured Probes

Probes for Topography Measurement

Topography - TappingMode

Topography - Contact Mode

Topography - PeakForce Tapping

Probes for High-Resolution Imaging
Probes for Measuring High Aspect Ratio Structures
Probes for Automated AFM Critical Metrology
Probes for High-Speed Imaging
Probes for Nanoelectrical Measurements
Probes for Mechanical Measurements

Force Curves based measurements

Contact-based measurements

Probes for Magnetic Characterization
Watch Now | 5 Minutes

Samples, Calibration Grids, Standards, and Accessories

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Presented by Ian Armstrong, Ph.D., North America Application Manager, Bruker (January 19, 2023)
Browse AFM Accessories
Watch Now | 13 Minutes

Recommended Probes for Bio Applications

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Presented by Ian Armstrong, Ph.D., North America Application Manager, Bruker (January 19, 2023)

       SEE RECOMMENDED PROBES FOR:

  • [00:00:11] High-resolution imaging
  • [00:02:00] Imaging cells
  • [00:06:17] High-speed imaging
  • [00:08:12] Mechanical mapping on soft samples
  • [00:09:15] Accurate mechanical and rheological measurements with sphere probes
  • [00:12:04] Q&A
Learn More: AFMs for Life Science

Featured Probes

Probes for High-Resolution Imaging
Probes for Imaging Cells
Probes for High-Speed Imaging
Probes for Mechanical Mapping on Soft Samples
Sphere Probes for Mechanical and Rheological Measurements

Featured Products and Technology