On-Demand Session: The Fundamentals of AFM Probe Selection
Learn how to select the right probe for your application
How to Select a Probe
PRESENTATION HIGHLIGHTS:
- [00:00:11] Overview of probe characteristics and considerations for selection
- [00:05:27] Probe selection based on AFM mode
- [00:06:25] Probe selection based on scan rate/imaging speed requirements
- [00:08:52] How to choose a probe coating
- [00:10:50] How to choose the right probe tip shape and radius
- [00:13:50] How to get probe recommendations using Bruker AFM software
- [00:15:27] Q&A
Recommended Probes for Material Science Applications
SEE RECOMMENDED PROBES FOR:
- [00:00:15] Topography measurements
- [00:05:29] High resolution imaging
- [00:06:22] Measuring high aspect ratio structures (trenches and lines, TSVs)
- [00:07:48] Automated AFM critical metrology
- [00:08:49] High-speed imaging
- [00:10:49] Mechanical measurements
- [00:14:25] Nanoelectrical measurements
- [00:18:50] Magnetic characterization
- [00:19:51] Q&A
Featured Probes
Topography - TappingMode
Topography - PeakForce Tapping
Force Curves based measurements
Contact-based measurements
Samples, Calibration Grids, Standards, and Accessories
Recommended Probes for Bio Applications
SEE RECOMMENDED PROBES FOR:
- [00:00:11] High-resolution imaging
- [00:02:00] Imaging cells
- [00:06:17] High-speed imaging
- [00:08:12] Mechanical mapping on soft samples
- [00:09:15] Accurate mechanical and rheological measurements with sphere probes
- [00:12:04] Q&A
