Beyond Surface Roughness: From Millimeter to Nano Scale – Can We Predict Surface Behavior?
Gain new insights into leading-edge techniques for surface roughness measurement in industrial applications.
Measuring Surface Roughness: ISO25178 Parameters Overview, Rules for Success
PRESENTATION HIGHLIGHTS:
- [00:00:00] Introduction to roughness measurement under the ISO25178 parameters
- [00:00:55] Why do we need to measure roughness and waviness?
- [00:08:24] Applying filters to roughness measurements
- [00:15:09] Additional parameters for measurements
- [00:19:44] Use Case: Cell roughness vs efficiency
- [00:20:42] Use Case: Wear of cylinder bore, functional parameters
Measuring Roughness from the Micron to Millimeter Scale – Featuring Bruker’s ContourX-500 Optical Profilometer
PRESENTATION HIGHLIGHTS:
- [00:00:17] Measuring a silicon carbide reference flat with PSI
- [00:02:30] Measuring a titanium roughness sample with VSI and different objectives
- [00:04:54] Measuring a milling surface sample
LIVE AUDIENCE Q&A:
- [00:08:27] Is there a difference in Z resolution between optical profiler and AFM instruments?
- [00:08:55] Can we use the same scale for the Z height as used for the X and Y axis?
- [00:10:11] Will the ContourX-500 measure the surface roughness of a silver nano ink printed on a flexible polymer-coated substrate?
- [00:11:30] If the surface looks easily measurable, can the need for Data Restore be easily prevented?
Selecting the Relevant Scales of Topography
PRESENTATION HIGHLIGHTS:
- [00:00:00] Introduction
- [00:01:27] Morphologies and Surfaces in Mechanics
- [00:05:28] Methods of Pre-Treatment
- [00:06:26] First Mesrug Analysis
- [00:08:02] Second Mesrug Analysis
- [00:10:01] Third Mesrug Analysis
- [00:11:05] Fourth Mesrug Analysis
- [00:12:53] Fifth Mesrug Analysis
- [00:14:43] Multi-Scale Characterization Method
- [00:15:45] Sixth Mesrug Analysis
- [00:17:55] 3D Multi-Scale Analysis Examples
- [00:25:20] High Def. Topography Earth Analysis
- [00:28:00] Live Audience Q&A - Can you please shortly explain the analysis of data based on fractile dimension?
Measuring Roughness on the Nanometer Scale – Featuring Bruker’s Dimension XR AFM
PRESENTATION HIGHLIGHTS:
- [00:00:10] Measuring a thin film coating sample
- [00:03:11] Measuring a titanium roughness sample
- [00:00:00] Comparing the measurements of the Dimension XR vs the ContourX-500
LIVE AUDIENCE Q&A:
- [00:10:14] When you do a measurement, is there a way to know when it is necessary to go to a higher lateral resolution?
- [00:12:08] It appears that you are scanning very fast for an AFM. Are you using any particular mode(s) allowing you to scan fast?
- [00:13:40] How can you bring the two techniques—AFM and Optical Profilometry—together? How do you find the same spot on the sample? Do you have to match the same roughness parameters?
- [00:15:15] How do you select a scan size when measuing a given roughness sample?
Featured Products and Technology
LIVE DEMONSTRATION | 15 MINUTES
Measuring Roughness from the Micron to Millimeter Scale – Featuring Bruker’s ContourX-500 Optical Profilometer
Presented by Vishal Panchal, Ph.D., EMEA Applications Scientist, Bruker
LIVE DEMONSTRATION | 15 MINUTES
Measuring Roughness on the Nanometer Scale – Featuring Bruker’s Dimension XR AFM
Presented by Vishal Panchal, Ph.D., EMEA Applications Scientist, Bruker
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