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Highest Resolution Characterization of Thin Films and Coatings; Topography & Physical Properties

PRESENTED BY SENLI GUO, PH.D., APPLICATION SCIENTIST, BRUKER (JUNE 9, 2021)

       PRESENTATION HIGHLIGHTS

  • [00:05:50] Information accessible via AFM-based surface topography measurement
  • [00:08:10] PeakForce Tapping introduction & example applications
  • [00:13:10] PeakForce TUNA introduction & example applications
  • [00:18:35] Sensing properties below the surface layer of multilayer films
  • [00:23:10] Live audience Q&A
  • [00:27:45] Live Demo: Conductivity mapping with PeakForce TUNA & the Dimension XR AFM

 


Are you interested in learning more about Bruker's AFM solutions for the study of films and coatings?

Presentation Highlights

Practical Examples of AFM-Based Analysis of Thin Films & Coatings:

USE CASE: Nanomechanical measurement of PVC film with PeakForce QNM

   

USE CASE: Measuring the conductivity of graphene samples with PeakForce TUNA
USE CASE: Nanomechanical mapping of components of a plastic food storage bag with PeakForce QNM

   

USE CASE: Nanothermal analysis of multilayer polymer films
USE CASE: Measuring the conductivity of dopped diamond samples with PeakForce TUNA