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▶ Watch On-Demand | 35 Minutes
Highest Resolution Characterization of Thin Films and Coatings; Topography & Physical Properties
PRESENTED BY SENLI GUO, PH.D., APPLICATION SCIENTIST, BRUKER (JUNE 9, 2021)
PRESENTATION HIGHLIGHTS
[00:05:50] Information accessible via AFM-based surface topography measurement
[00:08:10] PeakForce Tapping introduction &
example applications
[00:13:10] PeakForce TUNA introduction &
example applications
[00:18:35] Sensing properties below the surface layer of multilayer films
[00:23:10] Live audience Q&A
[00:27:45] Live Demo: Conductivity mapping with PeakForce TUNA & the
Dimension XR AFM
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Presentation Highlights
Practical Examples of AFM-Based Analysis of Thin Films & Coatings:
USE CASE: Nanomechanical measurement of PVC film with PeakForce QNM
USE CASE: Measuring the conductivity of graphene samples with PeakForce TUNA
USE CASE: Nanomechanical mapping of components of a plastic food storage bag with PeakForce QNM
USE CASE: Nanothermal analysis of multilayer polymer films
USE CASE: Measuring the conductivity of dopped diamond samples with PeakForce TUNA
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