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Measurement of the Roughness and Waviness of Thick Films and Coatings

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PRESENTED BY IAN ARMSTRONG, PH.D., NORTH AMERICA APPLICATIONS MANAGER, BRUKER (JUNE 9, 2021)

PRESENTATION HIGHLIGHTS

[00:01:50] Technical capabilities and data outputs of Bruker's WLI-based optical profilers
[00:04:50] How WLI works and how to read optical profilometry data for films and coatings
[00:06:15] Analysis of thick opaque films
[00:07:05] Analysis of thick transmissive films
[00:09:15] Analysis of thin films
[00:10:25] Live demo: Bruker's ContourX-500
[00:21:10] Live audience Q&A

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Presentation Highlights

Expert Answers to Live Audience Questions:

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Q: When operating in film mode, how does the ContourX-500 respond to "islands" of film (film and substrate in the same FOV)?

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Q: Can the ContourX-500 measure the thickness of 2+ layers of a transparent or translucent film?

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Q: What roughness standard is used to validate the roughness values/calibrate Bruker's 3D Optical Profiler systems?

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Q: How does the refractive index impact optical proflers' thickness calculations?

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Q: How could optical profiling be used to measure the thickness of an opaque film without any step?