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Map of Vc+ created by collecting spectra at points in a 10x10 matrix; Map of V0+ showing previously polled region.
Map of Vc+ created by collecting spectra at points in a 10x10 matrix; Map of V0+ showing previously polled region.
On-Demand Session | 30 Minutes

Demo: Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM)

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WATCH ANYTIME | 2 Expert-Led Demos | FREE TO ACCESS

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Learn how to characterize advanced properties of ferroelectric materials with SS-PFM mode.

  • See two real-time practical sessions led by Bruker applications experts.
  • Learn how SS-PFM compensates for electrostatics in PFM and DCUBE-PFM measurements.
  • Understand how to set up SS-PFM measurements using a script generator specifically made for switching spectroscopy.
  • Get practical guidance for using SS-PFM to generate a hysteresis loop and characterize properties of ferroelectric materials otherwise inaccessible by PFM modes.
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DNA-PAINT is a localization-based super-resolution method offering molecular resolution (< 5 nm) combined with unlimited multiplexing capabilities. DNA-PAINT reagents from Massive Photonics are a perfect match for the Bruker Vutara VXL microscope. In combination with the Bruker fluidic system, automated, multiplexed cellular imaging in 3D is now accessible out of the box.

Watch the webinar for practical guidance for DNA-PAINT sample preparation, image acquisition, and data analysis, as well as an introduction to:

  • The Vutara VXL super-resolution microscope and integrated fluidics unit;
  • The theoretical background of DNA-PAINT; and
  • The products available from Massive Photonics for DNA-PAINT experiments.

 

If you have any questions about these or any of our other products or services, please contact us. Follow @BrukerFM on Twitter for event, product, and webinar updates.

LIVE DEMONSTRATION: SWITCHING SPECTROSCOPY PIEZORESPONSE FORCE MICROSCOPY [performed on the Dimension Icon AFM]

Demo 1: Bruker Applications Scientist Sunli Guo, Ph.D., provides a comprehensive introduction to the capabilities and advantages of using SS-PFM for characterizing the properties of ferroelectric materials.

Demo 2: Bruker Senior Applications Scientist Bede Pittenger, Ph.D., demonstrates the use of DCUBE-PFM and SS-PFM to generate complementary data from the same PZT sample, illustrating the greatly improved sensitivity and accuracy of SS-PFM mode.